SCHEMBL605080

SCHEMBL605080

C=CCn1c2ccccc2c2ccc(C=C)cc21

nearest known ligand 0.46

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.44
HPGD P15428 2/20 0.44
HTT P42858 2/20 0.44
NPC1 O15118 2/20 0.42
ATM Q13315 2/20 0.42
L3MBTL1 Q9Y468 2/20 0.42
RAB9A P51151 2/20 0.42
CYP1A2 P05177 2/20 0.41
CYP2C19 P33261 2/20 0.41
TSHR P16473 2/20 0.41
CYP3A4 P08684 1/20 0.41
CYP2D6 P10635 1/20 0.41
CYP2C9 P11712 1/20 0.41
KMT2A Q03164 5/20 0.41
MEN1 O00255 4/20 0.41
USP2 O75604 2/20 0.41
TNNI3 P19429 1/20 0.41
TNNT2 P45379 1/20 0.41
TNNC1 P63316 1/20 0.41
APOBEC3G Q9HC16 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL604579 0.90 HTT (0.48) ALDH1A1HPGDHTTNPC1ATM
SCHEMBL29002800 0.88 PTGER4 (0.50) ALDH1A1HPGDHTTNPC1ATM
SCHEMBL553110 0.84 ALDH1A1 (0.49) ALDH1A1HPGDHTTNPC1ATM
SCHEMBL146503 0.84 CYP1A2 (0.56) ALDH1A1HPGDHTTNPC1RAB9A
SCHEMBL29514528 0.84 KDM4E (0.55) ALDH1A1HPGDHTTTSHRKMT2A
SCHEMBL2132476 0.84 KDM4E (0.55) ALDH1A1HPGDHTTTSHRKMT2A
SCHEMBL8158727 0.81 MAPT (0.40) ALDH1A1HTTNPC1ATML3MBTL1
SCHEMBL11783216 0.79 PGR (0.52) ALDH1A1
SCHEMBL26500391 0.79 GAA (0.48) ALDH1A1HPGDHTTNPC1ATM
SCHEMBL7132029 0.78 PTGER4 (0.60) ALDH1A1HPGDHTTNPC1ATM

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-3979495-A Method of making a photoreceptor XEROX CORPORATION (US) 1976-09-07 US claimed
CN-116333685-A Method for producing composition for polishing display glass substrate and method for polishing display substrate using the composition (株)伊诺肯公司 2023-06-27 CN disclosed
US-20150191607-A1 Anti-fouling Paints and Coatings REACTIVE SURFACES, LTD (US) 2015-07-09 US disclosed
US-20140196631-A1 VISUAL ASSAYS FOR COATINGS INCORPORATING BIOACTIVE ENZYMES FOR CATALYTIC FUNCTIONS REACTIVE SURFACE, LTD. (US) 2014-07-17 US disclosed
EP-1369906-B1 POLISHING COMPOUND AND METHOD FOR POLISHING SUBSTRATE HITACHI CHEMICAL CO LTD (JP) 2012-06-27 EP disclosed
US-20120097194-A1 Polymeric Coatings Incorporating Bioactive Enzymes for Catalytic Function REACTIVE SURFACES, LTD. (US) 2012-04-26 US disclosed
EP-2418258-A1 Polishing slurry and method of polishing substrate Hitachi Chemical Company, Ltd. (JP) 2012-02-15 EP disclosed
US-20110250626-A1 Visual Assays for Coatings Incorporating Bioactive Enzymes for Catalytic Functions REACTIVE SURFACES, LTD. (US) 2011-10-13 US disclosed
US-20110240064-A1 Polymeric Coatings Incorporating Bioactive Enzymes for Cleaning a Surface REACTIVE SURFACES, LTD. (US) 2011-10-06 US disclosed
US-8002860-B2 CMP abrasive, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive HITACHI CHEMICAL CO., LTD. (JP) 2011-08-23 US disclosed
US-20090253355-A1 CMP ABRASIVE, METHOD FOR POLISHING SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME, AND ADDITIVE FOR CMP ABRASIVE KOYAMA NAOYUKI 2009-10-08 US disclosed
US-7410409-B1 Abrasive compound for CMP, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive compound HITACHI CHEMICAL CO., LTD. (JP) 2008-08-12 US disclosed
US-20070169421-A1 CMP abrasive, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive KOYAMA NAOYUKI 2007-07-26 US disclosed
WO-2007018376-A1 PRODUCING METHOD FOR CERIUM-BASED GLASS POLISHING MATERIAL AND METHOD FOR USING THE SAME JOUNG IN (KR) 2007-02-15 WO disclosed
EP-1691401-A2 CMP abrasive, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for CMP abrasive Hitachi Chemical Co., Ltd. (JP) 2006-08-16 EP disclosed
US-6786945-B2 Polishing compound and method for polishing substrate HITACHI CHEMICAL CO., LTD. (JP) 2004-09-07 US disclosed
US-20040065022-A1 Polishing compound and method for polishing substrate HITACHI CHEMICAL CO., LTD. (JP) 2004-04-08 US disclosed
EP-1369906-A1 POLISHING COMPOUND AND METHOD FOR POLISHING SUBSTRATE HITACHI CHEMICAL COMPANY, LTD. (JP) 2003-12-10 EP disclosed
EP-1205965-A1 ABRASIVE COMPOUND FOR CMP, METHOD FOR POLISHING SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME, AND ADDITIVE FOR CMP ABRASIVE COMPOUND HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-05-15 EP disclosed
US-4076527-A TREATED VANADYL PHTHALOCYANINE PIGMENT PARTICLES XEROX CORPORATION (US) 1978-02-28 US disclosed