SCHEMBL609208

SCHEMBL609208

CC(=O)CC(=O)OOC(=O)CC(C)=O

nearest known ligand 0.67

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MGAM O43451 2/20 0.67
GAA P10253 2/20 0.67
SI P14410 2/20 0.67
MGAM2 Q2M2H8 2/20 0.67
TSHR P16473 5/20 0.40
HTT P42858 1/20 0.39
ALDH1A1 P00352 6/20 0.39
TDP1 Q9NUW8 2/20 0.39
KDM4E B2RXH2 3/20 0.38
KDM6B O15054 1/20 0.38
KDM5C P41229 1/20 0.38
EGLN1 Q9GZT9 1/20 0.38
PHF8 Q9UPP1 1/20 0.38
KDM2A Q9Y2K7 1/20 0.38
TRPA1 O75762 1/20 0.37
HSD17B10 Q99714 2/20 0.36
LMNA P02545 4/20 0.33
CES2 O00748 1/20 0.32
SLC15A2 Q16348 1/20 0.32
CA2 P00918 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2812474 0.91 MGAM (0.57) MGAMGAASIMGAM2TSHR
SCHEMBL9436391 0.88 MGAM (0.60) MGAMGAASIMGAM2TSHR
SCHEMBL8364037 0.85
SCHEMBL18832117 0.83 PHF8 (0.54) MGAMGAASIMGAM2TSHR
SCHEMBL29071013 0.83 MGAM (0.48) MGAMGAASIMGAM2TSHR
Propionic Acid SCHEMBL28557464 0.83 MGAM (0.48) MGAMGAASIMGAM2TSHR
SCHEMBL727178 0.83 ALDH1A1 (0.48) MGAMGAASIMGAM2TSHR
SCHEMBL13719657 0.81 MGAM (0.52) MGAMGAASIMGAM2TSHR
SCHEMBL7638055 0.81 MGAM (0.52) MGAMGAASIMGAM2TSHR
SCHEMBL2874791 0.81 MGAM (0.46) MGAMGAASIMGAM2TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 47 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-1090210-A None JP disclosed
JP-7228799-A None JP disclosed
CN-119452740-A Structure and wiring board 太阳控股株式会社 2025-02-14 CN disclosed
WO-2023238925-A1 RADICAL POLYMERIZABLE COMPOSITION AND POLYMERIZED PRODUCT THEREOF 株式会社日本触媒 2023-12-14 WO disclosed
CN-111655662-B Compound, resin, composition, resist pattern forming method, circuit pattern forming method, and resin purifying method 三菱瓦斯化学株式会社 2023-09-26 CN disclosed
CN-114829381-A Genetically modified plants and methods for making the same 恩派瑞安神经科学公司 2022-07-29 CN disclosed
CN-110651004-B Conductive resin composition and method for manufacturing shield package using same 拓自达电线株式会社 2022-03-25 CN disclosed
US-20210301129-A1 POLY(PHENYLENE ETHER), CURABLE COMPOSITION CONTAINING POLY(PHENYLENE ETHER), DRY FILM, PREPREG, CURED OBJECT, LAMINATE, AND ELECTRONIC COMPONENT TAIYO HOLDINGS CO., LTD. (JP) 2021-09-30 US disclosed
CN-112996839-A Material for forming film for lithography, composition for forming film for lithography, underlayer film for lithography, and pattern formation method 三菱瓦斯化学株式会社 2021-06-18 CN disclosed
CN-110302727-B Millimeter-sized microcapsule and preparation method thereof 江南大学 2020-11-06 CN disclosed
US-20070049655-A1 Radiation-curable composition and cured product thereof NIPPON SHOKUBAI CO., LTD. (JP) 2007-03-01 US disclosed
US-20060231525-A1 Forming microphase-separated structure in film of graft or block copolymer with a chain of polyacrylonitrile, polycyclohexadiene derivative, polybutadiene, polysilane, polysiloxane, polyamic acid or polyaniline and thermally decomposable polymer chain; heating to decompose the decomposable phase; etching ASAKAWA KOJI 2006-10-19 US disclosed
US-7097781-B2 Method for manufacturing porous structure and method for forming pattern KABUSHIKI KAISHA TOSHIBA (JP) 2006-08-29 US disclosed
US-7090784-B2 Forming pattern using graft polymer containing metal particles; overcoating substrates; removal polymer KABUSHIKI KAISHA TOSHIBA (JP) 2006-08-15 US disclosed
US-20040050816-A1 Forming pattern using graft polymer containing metal particles; overcoating substrates; removal polymer KABUSHIKI KAISHA TOSHIBA (JP) 2004-03-18 US disclosed
US-20030222048-A1 Method for manufacturing porous structure and method for forming pattern KABUSHIKI KAISHA TOSHIBA (JP) 2003-12-04 US disclosed
US-6565763-B1 Method for manufacturing porous structure and method for forming pattern KABUSHIKI KAISHA TOSHIBA (JP) 2003-05-20 US disclosed
JP-H07228799-A COATING RESIN COMPOSITION AICA KOGYO CO LTD 1995-08-29 JP disclosed
JP-S6490210-A HARD COATING COMPOSITION AND ITS CURE KAYAKU NOURY CORP 1989-04-06 JP disclosed
US-4413072-A Mixtures of polyurethanes and unsaturated polyester resins BAYER AKTIENGESELLSCHAFT (DE) 1983-11-01 US disclosed