SCHEMBL60930

SCHEMBL60930

Cc1ccc(S(=O)(=O)C(=[N+]=[N-])S(C)(=O)=O)cc1

nearest known ligand 0.43

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
GAA P10253 2/20 0.43
CA1 P00915 3/20 0.41
CA2 P00918 3/20 0.41
MMP1 P03956 1/20 0.41
MMP2 P08253 1/20 0.41
MMP9 P14780 1/20 0.41
MMP8 P22894 1/20 0.41
MMP13 P45452 1/20 0.41
CA12 O43570 1/20 0.41
CA3 P07451 1/20 0.41
CA6 P23280 1/20 0.41
CA5A P35218 1/20 0.41
CA7 P43166 1/20 0.41
CA9 Q16790 1/20 0.41
CA5B Q9Y2D0 1/20 0.41
TLR9 Q9NR96 1/20 0.39
SMN1; SMN2 Q16637 1/20 0.38
F2 P00734 1/20 0.38
PRSS1 P07477 1/20 0.38
PRSS2 P07478 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL36092 0.90 GAA (0.48) GAACA1CA2MMP1MMP2
SCHEMBL8072003 0.85 GAA (0.43) GAACA1CA2MMP1MMP2
SCHEMBL14600187 0.84 MAPT (0.47) GAACA1CA2MMP1MMP2
SCHEMBL21838871 0.84 MAPT (0.47) GAACA1CA2MMP1MMP2
SCHEMBL28293012 0.84 TLR9 (0.42) GAACA1CA2MMP1MMP2
SCHEMBL3193127 0.83 SMN1; SMN2 (0.40) CA1CA2MMP1MMP2MMP9
SCHEMBL563060 0.82 ALDH1A1 (0.44) GAASMN1; SMN2ALDH1A1LMNAPOLB
SCHEMBL3207137 0.82 ALDH1A1 (0.42) GAACA1CA2MMP1MMP2
SCHEMBL14650732 0.82 MAPT (0.48) GAACA1CA2CA12CA3
SCHEMBL7688694 0.80 CA2 (0.42) GAACA1CA2MMP1MMP2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1389 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250021002-A1 BOTTOM ANTI-REFLECTIVE COATING FOR DEEP ULTRAVIOLET LITHOGRAPHY, PREPARATION METHOD THEREFOR AND USE THEREOF CHINA ADVANCED LITHOGRAPHIC MATERIAL TECHNOLOGY CO. LTD. (CN) 2025-01-16 US claimed
CN-116102680-B Bottom anti-reflection coating and preparation method and application thereof 上海新阳半导体材料股份有限公司 2024-02-13 CN claimed
CN-116102937-B Bottom anti-reflection coating and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-10-20 CN claimed
CN-116102938-B Bottom anti-reflection coating for deep ultraviolet lithography and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-10-20 CN claimed
CN-116102939-B Bottom anti-reflection coating for deep ultraviolet lithography and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-10-03 CN claimed
CN-115873176-B Bottom anti-reflection coating for DUV lithography and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-09-26 CN claimed
CN-115873175-B Bottom anti-reflection coating for DUV lithography and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-09-12 CN claimed
WO-2023082371-A1 BOTTOM ANTI-REFLECTIVE COATING FOR DEEP ULTRAVIOLET LITHOGRAPHY, PREPARATION METHOD THEREFOR AND USE THEREOF 上海新阳半导体材料股份有限公司 2023-05-19 WO claimed
CN-116102680-A Bottom anti-reflection coating and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-05-12 CN claimed
CN-116102937-A Bottom anti-reflection coating and preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-05-12 CN claimed
US-20080174051-A1 AROMATIC VINYL ETHER BASED REVERSE-TONE STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2008-07-24 US claimed
US-20080169268-A1 PROCESSES AND MATERIALS FOR STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2008-07-17 US claimed
EP-1938149-A2 LOW ACTIVATION ENERGY DISSOLUTION MODIFICATION AGENTS FOR PHOTORESIST APPLICATIONS International Business Machines Corporation (US) 2008-07-02 EP claimed
US-7358029-B2 Polymer, a photoacid generator and a dissolution modification agent; patterning; image resolution INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-04-15 US claimed
US-20070298176-A1 AROMATIC VINYL ETHER BASED REVERSE-TONE STEP AND FLASH IMPRINT LITHOGRAPHY GLOBALFOUNDRIES INC. (KY) 2007-12-27 US claimed
US-20070231734-A1 Polymer, a photoacid generator and a dissolution modification agent; patterning; image resolution GLOBALFOUNDRIES U.S. INC. 2007-10-04 US claimed
US-20070202436-A1 Photosensitive compositions useful for forming active patterns, methods of forming such active patterns and organic memory devices incorporating such active patterns SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-08-30 US claimed
WO-2007039346-A2 LOW ACTIVATION ENERGY DISSOLUTION MODIFICATION AGENTS FOR PHOTORESIST APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2007-04-12 WO claimed
US-20070051697-A1 Processes and materials for step and flash imprint lithography GLOBALFOUNDRIES INC. (KY) 2007-03-08 US claimed
US-5994022-A BECOMES SOLUBLE IN ALKALI DEVELOPING SOLUTION BY ACTION OF AN ACID JSR CORPORATION (JP) 1999-11-30 US claimed