SCHEMBL6278450

SCHEMBL6278450

CCOC(C)Oc1ccc(C=CC=Cc2ccc(OC(=O)OC(C)(C)c3ccc(C=CO)cc3)cc2)cc1

nearest known ligand 0.32

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CYP1A1 P04798 1/20 0.32
CYP1B1 Q16678 1/20 0.32
MAOB P27338 1/20 0.32
BCHE P06276 1/20 0.32
ACHE P22303 1/20 0.32
PTGS2 P35354 1/20 0.32
ELANE P08246 2/20 0.32
KDM4E B2RXH2 1/20 0.31
MEN1 O00255 1/20 0.31
LMNA P02545 1/20 0.31
TTR P02766 1/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
MAPT P10636 1/20 0.31
KMT2A Q03164 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
LTB4R Q15722 1/20 0.31
LTB4R2 Q9NPC1 1/20 0.31
TAS1R3 Q7RTX0 1/20 0.31
TAS1R1 Q7RTX1 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3838403 0.86 CYP3A4 (0.33) MAOBBCHEACHEPTGS2ELANE
SCHEMBL6551257 0.86 BCHE (0.35) BCHEACHEPTGS2ELANEKDM4E
SCHEMBL4968520 0.86 FBP1 (0.33) CYP1A1CYP1B1MAOBBCHEACHE
SCHEMBL6279560 0.80 BCHE (0.36) BCHEACHEPTGS2KDM4EMEN1
SCHEMBL4967712 0.80 ELANE (0.34) MAOBBCHEACHEPTGS2ELANE
SCHEMBL6275962 0.78 BCHE (0.35) BCHEACHEPTGS2KDM4EMEN1
SCHEMBL6843705 0.78 ELANE (0.38) MAOBBCHEELANE
SCHEMBL6551123 0.78 HDAC8 (0.35) CYP1A1CYP1B1MAOBELANEKDM4E
SCHEMBL4967554 0.78 BCHE (0.34) BCHEACHEPTGS2KDM4EMEN1
SCHEMBL6554747 0.77 ELANE (0.37) BCHEACHEPTGS2ELANEKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0875787-B1 Method for reducing the substrate dependence of resist WAKO PURE CHEM IND LTD (JP) 2005-12-14 EP claimed
EP-0875787-B1 Method for reducing the substrate dependence of resist WAKO PURE CHEM IND LTD (JP) 2005-12-14 EP disclosed
EP-0789279-B2 Polymer and resist material WAKO PURE CHEM IND LTD (JP) 2004-12-08 EP disclosed
US-6656660-B1 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-12-02 US disclosed
EP-0780732-B1 Polymer composition and resist material WAKO PURE CHEM IND LTD (JP) 2003-07-09 EP disclosed
US-6303264-B1 PROFILE OF PATTERN OF QUARTER MICRON ORDER WITHOUT CAUSING FOOTING, WHILE RETAINING HIGH RESOLUTION ABILITY AND HIGH SENSITIVITY WAKO PURE CHEMICAL INDUSTRIES, LTD (JP) 2001-10-16 US disclosed
EP-0789279-B1 Polymer and resist material WAKO PURE CHEM IND LTD (JP) 2001-03-21 EP disclosed
EP-1024406-A1 Resist composition WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 2000-08-02 EP disclosed
US-6033826-A POLYHYDROXYSTYRENE DERIVATIVE CONTAINING AN ACETAL OR KETAL GROUP WHICH CAN EASILY BE ELIMINATED IN THE PRESENCE OF AN ACID IN THE MOLECULE AND HAVING A VERY NARROW MOLECULAR WEIGHT DISTRIBUTION GIVES A RESIST MATERIAL WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2000-03-07 US disclosed
US-5976759-A ALKALI SOLUBLE BY HEATING WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1999-11-02 US disclosed
EP-0875787-A1 Method for reducing the substrate dependence of resist Wako Pure Chemical Industries, Ltd. (JP) 1998-11-04 EP disclosed
EP-0789279-A1 Polymer and resist material WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1997-08-13 EP disclosed
EP-0780732-A2 Polymer composition and resist material WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1997-06-25 EP disclosed