SCHEMBL6542955

SCHEMBL6542955

O=C(c1ccc(O)c2ccccc12)C(Br)Br

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 6/20 0.50
CDC25B P30305 2/20 0.44
HDAC3 O15379 1/20 0.41
EP300 Q09472 1/20 0.41
KAT2B Q92831 1/20 0.41
KAT8 Q9H7Z6 1/20 0.41
NCOR2 Q9Y618 1/20 0.41
LDHA P00338 1/20 0.40
CTSB P07858 2/20 0.39
THRB P10828 1/20 0.39
GSK3B P49841 1/20 0.39
CAPN1 P07384 1/20 0.39
CTSL P07711 1/20 0.39
KDM4E B2RXH2 2/20 0.38
MEN1 O00255 2/20 0.38
KMT2A Q03164 2/20 0.38
NSD2 O96028 1/20 0.38
POLB P06746 1/20 0.38
MAPT P10636 1/20 0.38
MCL1 Q07820 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11893584 0.81 PRNP (0.50) GSK3BKDM4EMEN1KMT2AMAPT
SCHEMBL8445974 0.79 KDM4E (0.54) GSK3BKDM4EMEN1KMT2AMAPT
SCHEMBL678559 0.75 IDO1 (0.59) IDO1CDC25BHDAC3EP300KAT2B
SCHEMBL29497936 0.75 IDO1 (0.59) IDO1CDC25BHDAC3EP300KAT2B
SCHEMBL3924866 0.74 IDO1 (0.56) IDO1CDC25BHDAC3EP300KAT2B
Hydrochloric Acid SCHEMBL3924869 0.74 LDHA (0.57) IDO1CDC25BHDAC3EP300KAT2B
SCHEMBL31655501 0.74 ATM (0.62) IDO1CDC25BHDAC3EP300KAT2B
SCHEMBL5708577 0.74 ATM (0.62) IDO1CDC25BHDAC3EP300KAT2B
Water SCHEMBL29153729 0.74 THRB (0.57) IDO1CDC25BHDAC3EP300KAT2B
SCHEMBL7400105 0.74 MAPT (0.60) IDO1CDC25BHDAC3EP300KAT2B

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-7159992-A None JP disclosed
US-6790564-B2 FOR USE IN PRODUCING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICES; EFFICIENCY RENESAS TECHNOLOGY CORPORATION (JP) 2004-09-14 US disclosed
EP-0911153-B1 Image forming method KONISHIROKU PHOTO IND (JP) 2003-12-10 EP disclosed
US-20020086222-A1 Photomask and manufacturing method of an electronic device therewith RENESAS ELECTRONICS CORPORATION (JP) 2002-07-04 US disclosed
US-6319649-B1 CAN FORM PATTERN WITH HIGH SENSITIVITY, RESOLUTION ABILITY AND STABILITY, ACCURACY HITACHI, LTD. (JP) 2001-11-20 US disclosed
US-6174646-B1 IMAGEWISE HEATING OR EXPOSING IMAGE FORMING MATERIAL TO LASER WHEREIN IMAGE FORMING MATERIAL COMPRISES SUPPORT HAVING RADIATION SENSITIVE LAYER CONTAINING DYE, AN ACID GENERATING COMPOUND CAPABLE OF GENERATING ACID ON IRRADIATION KONICA CORPORATION (JP) 2001-01-16 US disclosed
EP-0911153-A1 Image forming method KONICA CORPORATION (JP) 1999-04-28 EP disclosed
JP-H07159992-A PATTERN FORMING MATERIAL AND PATTERN FORMING METHOD HITACHI LTD 1995-06-23 JP disclosed
EP-0620500-A2 Resist and pattern formation using the same HITACHI, LTD. (JP) 1994-10-19 EP disclosed