Indene

Indene

SCHEMBL6834259

C1=Cc2ccccc2C1.C=C(C)C(=O)OC(C)(C)C.C=Cc1ccccc1O

nearest known ligand 0.36

Full drug profile on Sugi Atlas →

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
CYP2D6 P10635 1/20 0.36
CYP2C19 P33261 1/20 0.36
MAPT P10636 2/20 0.32
LMNA P02545 1/20 0.32
KDM4E B2RXH2 1/20 0.30
NPC1 O15118 1/20 0.30
MAPK1 P28482 1/20 0.30
RAB9A P51151 1/20 0.30
ATM Q13315 1/20 0.30
NPSR1 Q6W5P4 1/20 0.30
TDP1 Q9NUW8 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Indene SCHEMBL6321226 0.85 CYP2D6 (0.36) CYP2D6CYP2C19MAPTLMNAKDM4E
SCHEMBL6858822 0.85 MAPT (0.41) MAPTLMNAKDM4ENPC1MAPK1
Indene SCHEMBL546792 0.81 CYP2D6 (0.39) CYP2D6CYP2C19KDM4E
Indene SCHEMBL6053387 0.81 ELANE (0.37)
Indene SCHEMBL6053428 0.80 ELANE (0.39) CYP2D6CYP2C19MAPTLMNAKDM4E
Styrene SCHEMBL4143998 0.79 MAPT (0.37) CYP2C19MAPTLMNAKDM4ENPC1
Indene SCHEMBL6834156 0.79 CYP2D6 (0.32) CYP2D6CYP2C19
Indene SCHEMBL6835844 0.79 MEN1 (0.39) CYP2C19MAPTLMNANPC1RAB9A
Indene SCHEMBL6053432 0.77 MAPT (0.39) CYP2D6CYP2C19MAPTLMNAKDM4E
SCHEMBL6371474 0.75 MAPT (0.33) CYP2D6CYP2C19MAPTLMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6746817-B2 ACID LABILE GROUPS INCREASE ALKALI SOLUBILITY; HAVING INCREASED ALKALI DISSOLUTION RATE BEFORE AND AFTER RADIATION EXPOSURE, HIGH SENSITIVITY, HIGH RESOLUTION, AND ETCHING RESISTANCE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-06-08 US disclosed
US-20020081521-A1 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-06-27 US disclosed