SCHEMBL685731

SCHEMBL685731

C=C(C)C(=O)OC1(C(C)C)CCCCC1

nearest known ligand 0.37

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.37
ALDH1A1 P00352 2/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL685726 1.00 TSHR (0.37) TSHRALDH1A1
SCHEMBL686090 1.00 TSHR (0.37) TSHRALDH1A1
SCHEMBL47304 0.98 TSHR (0.38) TSHRALDH1A1
SCHEMBL674145 0.90 TSHR (0.41) TSHRALDH1A1
SCHEMBL17247248 0.85 TSHR (0.40) TSHRALDH1A1
SCHEMBL4406132 0.83 TSHR (0.37) TSHRALDH1A1
SCHEMBL17247223 0.82 TSHR (0.41) TSHRALDH1A1
SCHEMBL13172057 0.81 TSHR (0.38) TSHRALDH1A1
SCHEMBL7665648 0.81 TSHR (0.34) TSHRALDH1A1
SCHEMBL4399277 0.81 TSHR (0.38) TSHRALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 595 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120119462-A Preparation method of hydrophobic breathable cellulose fabric 中原工学院 2025-06-10 CN claimed
CN-119613607-A Preparation method of 193nm photoresist resin 江苏集萃光敏电子材料研究所有限公司 2025-03-14 CN claimed
CN-119148465-A Photosensitive resin composition, photosensitive dry film and application thereof 杭州福斯特电子材料有限公司 2024-12-17 CN claimed
CN-118625599-A Photosensitive resin composition, photosensitive dry film and preparation method thereof 杭州福斯特电子材料有限公司 2024-09-10 CN claimed
CN-120119462-A Preparation method of hydrophobic breathable cellulose fabric 中原工学院 2025-06-10 CN disclosed
EP-4560309-A1 SEQUENCE ANALYZING METHOD, SEQUENCE ANALYZING DEVICE, POLYMERIZATION CONDITION PROPOSING DEVICE, AND AUTOMATIC SYNTHESIZING DEVICE National Institute for Materials Science (JP) 2025-05-28 EP disclosed
CN-119613607-A Preparation method of 193nm photoresist resin 江苏集萃光敏电子材料研究所有限公司 2025-03-14 CN disclosed
WO-2025033010-A1 COMPOSITION ESTIMATION METHOD, COMPOSITION ESTIMATION DEVICE, PROGRAM, SAMPLE CONTAINER, AND THERMOGRAVIMETRY/MASS SPECTROMETRY METHOD 国立研究開発法人物質・材料研究機構 2025-02-13 WO disclosed
CN-118625599-A Photosensitive resin composition, photosensitive dry film and preparation method thereof 杭州福斯特电子材料有限公司 2024-09-10 CN disclosed
US-12032290-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2024-07-09 US disclosed
WO-2024018725-A1 SEQUENCE ANALYZING METHOD, SEQUENCE ANALYZING DEVICE, POLYMERIZATION CONDITION PROPOSING DEVICE, AND AUTOMATIC SYNTHESIZING DEVICE 国立研究開発法人物質・材料研究機構 2024-01-25 WO disclosed
US-11835849-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2023-12-05 US disclosed
US-7423102-B2 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-09-09 US disclosed
US-20080193874-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-08-14 US disclosed
US-20080193874-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-08-14 US disclosed
US-20080166660-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-10 US disclosed
US-20080166660-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-10 US disclosed
US-7205090-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-17 US disclosed
US-7205090-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-17 US disclosed
US-20060014913-A1 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-01-19 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11835849-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device RER1, TERB1, TRRAP TSHR 1473/4885ALDH1A1 2433/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.