1,2-Naphthoquinone

1,2-Naphthoquinone

SCHEMBL686745

O=C1C=Cc2ccccc2C1=O.[N-]=[N+]=NS(=O)(=O)N=[N+]=[N-]

nearest known ligand 0.65

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Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PTPRC P08575 5/20 0.65
PTPN1 P18031 4/20 0.65
MEN1 O00255 3/20 0.65
KMT2A Q03164 3/20 0.65
KDM4E B2RXH2 3/20 0.65
IDO1 P14902 2/20 0.65
CES1 P23141 2/20 0.65
ALDH1A1 P00352 2/20 0.65
MAPT P10636 2/20 0.65
HPGD P15428 2/20 0.65
PTPN22 Q9Y2R2 2/20 0.65
LMNA P02545 1/20 0.65
BCHE P06276 1/20 0.65
POLB P06746 1/20 0.65
THRB P10828 1/20 0.65
PKM P14618 1/20 0.65
ALOX15 P16050 1/20 0.65
ACHE P22303 1/20 0.65
RECQL P46063 1/20 0.65
HSD17B10 Q99714 1/20 0.65

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
1,2-Naphthoquinone SCHEMBL3027885 0.88 PTPRC (0.61) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL8434680 0.88 PTPRC (0.61) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL4860140 0.88 PTPRC (0.61) PTPRCPTPN1MEN1KMT2AKDM4E
Naphthoquinone SCHEMBL106247 0.84 IDO1 (0.54) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL29368763 0.84 PTPRC (0.83) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL9225602 0.84 PTPRC (0.83) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL5447857 0.83 PTPRC (0.54) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL3027882 0.83 PTPRC (0.54) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL8376775 0.82 PTPRC (0.53) PTPRCPTPN1MEN1KMT2AKDM4E
1,2-Naphthoquinone SCHEMBL9225610 0.81 PTPRC (0.77) PTPRCPTPN1MEN1KMT2AKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 70 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116836389-B Low-temperature-curable positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2024-01-26 CN claimed
CN-116836388-B Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-12-15 CN claimed
CN-116836388-A Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-10-03 CN claimed
CN-116836389-A Low-temperature-curable positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-10-03 CN claimed
CN-116149140-B Positive photosensitive resin composition with high chemical resistance and preparation method and application thereof 明士(北京)新材料开发有限公司 2023-07-14 CN claimed
CN-116149140-A Positive photosensitive resin composition with high chemical resistance and preparation method and application thereof 明士(北京)新材料开发有限公司 2023-05-23 CN claimed
EP-2957955-B1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PHOTO-CURABLE DRY FILM AND METHOD FOR PRODUCING SAME, LAYERED PRODUCT, PATTERNING PROCESS, AND SUBSTRATE SHINETSU CHEMICAL CO (JP) 2018-06-06 EP claimed
US-9557645-B2 Positive photosensitive resin composition, photo-curable dry film and method for producing same, layered product, patterning process, and substrate SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-01-31 US claimed
US-20150370166-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PHOTO-CURABLE DRY FILM AND METHOD FOR PRODUCING SAME, LAYERED PRODUCT, PATTERNING PROCESS, AND SUBSTRATE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-24 US claimed
EP-2957955-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PHOTO-CURABLE DRY FILM AND METHOD FOR PRODUCING SAME, LAYERED PRODUCT, PATTERNING PROCESS, AND SUBSTRATE Shin-Etsu Chemical Co., Ltd. (JP) 2015-12-23 EP claimed
EP-1664928-B1 POSITIVE PHOTORESIST COMPOSITION AND RESIST PATTERN FORMATION TOKYO OHKA KOGYO CO LTD (JP) 2012-02-29 EP claimed
US-20060183048-A1 Positive photoresist composition and resist pattern formation TOKYO OHKA KOGYO CO., LTD. (JP) 2006-08-17 US claimed
EP-1664928-A2 POSITIVE PHOTORESIST COMPOSITION AND RESIST PATTERN FORMATION TOKYO OHKA KOGYO CO., LTD. (JP) 2006-06-07 EP claimed
WO-2005029184-A2 POSITIVE PHOTORESIST COMPOSITION AND RESIST PATTERN FORMATION TOKYO OHKA KOGYO CO., LTD. (JP) 2005-03-31 WO claimed
JP-7253664-A None JP disclosed
JP-10269521-A None JP disclosed
CN-113527101-B Novel compound, polymer, process for producing the same, photosensitive resin composition, pattern forming process, cured film, and electronic component 信越化学工业株式会社 2024-04-23 CN disclosed
US-20010035343-A1 Fine pattern forming method, developing/washing device used for the same, plating method using the same, and manufacturing method of thin film magnetic head using the same TDK CORPORATION 2001-11-01 US disclosed
JP-H10269521-A FORMATION OF MAGNETIC POLE OF THIN-FILM MAGNETIC HEAD TDK CORP 1998-10-09 JP disclosed
JP-H07253664-A PHOTOSENSITIVE RESIN COMPOSITION SUMITOMO CHEM CO LTD 1995-10-03 JP disclosed