SCHEMBL6912158

SCHEMBL6912158

C=C(C)C(=O)OC1(C)CCCCCCCCCCC1

nearest known ligand 0.39

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.39
CYP19A1 P11511 1/20 0.39
TSHR P16473 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
THRB P10828 1/20 0.31
MEN1 O00255 1/20 0.30
CYP3A4 P08684 1/20 0.30
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1832545 1.00 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRSMN1; SMN2THRB
SCHEMBL28137014 1.00 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRSMN1; SMN2THRB
SCHEMBL74808 1.00 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRSMN1; SMN2THRB
SCHEMBL685576 1.00 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRSMN1; SMN2THRB
SCHEMBL685580 1.00 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRSMN1; SMN2THRB
SCHEMBL47313 0.98 ALDH1A1 (0.41) ALDH1A1CYP19A1TSHRTHRB
Methacrylic Acid SCHEMBL20573813 0.94 CYP19A1 (0.36) ALDH1A1CYP19A1
SCHEMBL673273 0.94 ALDH1A1 (0.41) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL11206600 0.93 ALDH1A1 (0.54) ALDH1A1CYP19A1TSHRSMN1; SMN2MEN1
Acrylic Acid SCHEMBL27616773 0.89 CYP19A1 (0.34) ALDH1A1CYP19A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 59 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1489459-B1 Positive resist composition and method of forming pattern using the same FUJIFILM CORP (JP) 2015-10-14 EP disclosed
US-9023580-B2 Method of forming polymeric compound, resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-05-05 US disclosed
EP-2186838-B1 METHOD FOR PRODUCING STAR POLYMER NIPPON SODA CO (JP) 2014-08-27 EP disclosed
US-20130137049-A1 METHOD OF FORMING POLYMERIC COMPOUND, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-05-30 US disclosed
EP-1752479-B1 ACRYLIC STAR POLYMER NIPPON SODA CO (JP) 2013-02-27 EP disclosed
EP-1892255-B1 ACRYLIC ACID POLYMER NIPPON SODA CO (JP) 2012-08-01 EP disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-8067515-B2 Method of producing an acrylic acid-based polymer NIPPON SODA CO., LTD. (JP) 2011-11-29 US disclosed
US-8067515-B2 Method of producing an acrylic acid-based polymer NIPPON SODA CO., LTD. (JP) 2011-11-29 US disclosed
US-7192681-B2 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-03-20 US disclosed
US-7192681-B2 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-03-20 US disclosed
US-7189492-B2 Photosensitive composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-03-13 US disclosed
US-7189492-B2 Photosensitive composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-03-13 US disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7179579-B2 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7179579-B2 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
EP-1752479-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2007-02-14 EP disclosed
WO-2004041770-A1 CHEMICALLY AMPLIFIED POLYMER HAVING PENDANT GROUP WITH CYCLODODECYL AND RESIST COMPOSITION COMPRISING THE SAME DONGJIN SEMICHEM CO., LTD. (KR) 2004-05-21 WO disclosed