SCHEMBL47313

SCHEMBL47313

C=C(C)C(=O)OC1(C)CCCC1

nearest known ligand 0.41

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.41
CYP19A1 P11511 1/20 0.37
TSHR P16473 3/20 0.33
THRB P10828 1/20 0.31
ELANE P08246 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL74808 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL685580 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL28137014 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL685576 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL1832545 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL6912158 0.98 ALDH1A1 (0.39) ALDH1A1CYP19A1TSHRTHRB
SCHEMBL673273 0.96 ALDH1A1 (0.41) ALDH1A1CYP19A1TSHRTHRBELANE
Methacrylic Acid SCHEMBL20573813 0.92 CYP19A1 (0.36) ALDH1A1CYP19A1ELANE
SCHEMBL13900356 0.91 ALDH1A1 (0.44) ALDH1A1TSHRTHRBELANE
SCHEMBL27945670 0.91 ALDH1A1 (0.44) ALDH1A1TSHRTHRBELANE

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1687 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119613607-A Preparation method of 193nm photoresist resin 江苏集萃光敏电子材料研究所有限公司 2025-03-14 CN claimed
CN-119285842-A Fluorine-containing polymer, preparation method thereof and ArF immersed photoresist prepared from fluorine-containing polymer 瑞红(苏州)电子化学品股份有限公司 2025-01-10 CN claimed
CN-119148465-A Photosensitive resin composition, photosensitive dry film and application thereof 杭州福斯特电子材料有限公司 2024-12-17 CN claimed
CN-118853024-A High-nickel ternary positive electrode binder and preparation method and application thereof 深圳大学 2024-10-29 CN claimed
CN-114637165-B Composition for photoresist top layer coating and polymer preparation method thereof 中节能万润股份有限公司 2024-09-17 CN claimed
CN-118625599-A Photosensitive resin composition, photosensitive dry film and preparation method thereof 杭州福斯特电子材料有限公司 2024-09-10 CN claimed
CN-115536776-A Resin for photoresist, preparation method thereof and photoresist prepared from resin 瑞红(苏州)电子化学品股份有限公司 2022-12-30 CN claimed
CN-115260030-A Process preparation method and production device of methacrylate photoresist monomer 濮阳惠成电子材料股份有限公司 2022-11-01 CN claimed
CN-114637165-A Composition for top coating of photoresist and preparation method of polymer of composition 中节能万润股份有限公司 2022-06-17 CN claimed
CN-102472971-B chemically amplified photoresist composition and method of use thereof 国际商业机器公司 2016-12-07 CN claimed
CN-122071553-A Preparation method of negative development photoresist resin 万华化学集团股份有限公司 2026-05-22 CN disclosed
WO-2026101739-A1 CYCLIC SULFONATE COMPOUNDS AS PHOTOACID GENERATORS IN RESIST APPLICATIONS HERAEUS EPURIO LLC (US) 2026-05-15 WO disclosed
US-12625429-B2 Resist composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-05-12 US disclosed
US-12607933-B2 Polymer compositions having photoacid generators and photoresists DUPONT ELECTRONICS, INC. (US) 2026-04-21 US disclosed
US-12596303-B2 Resist composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-07 US disclosed
US-20050171226-A1 Radiation sensitive resin composition JSR CORPORATION (JP) 2005-08-04 US disclosed
US-6379861-B1 POLY(METH)ACRYLATE ESTER WITH TERTIARY OR QUATERNARY CARBON AND PHOTOACTIVE COMPOUND; HIGH RESOLUTION RELIEF IMAGES; CHEMICALLY-AMPLIFIED POSITIVES SHIPLEY COMPANY, L.L.C. 2002-04-30 US disclosed
US-6136501-A PHOTORESIST COMPOSITION COMPRISING PHOTOACTIVE COMPONENT AND POLYMER THAT COMPRISES ESTER GROUPS SHIPLEY COMPANY, L.L.C. (US) 2000-10-24 US disclosed
US-6010826-A Resist composition NIPPON ZEON CO., LTD. (JP) 2000-01-04 US disclosed
EP-0786701-A1 RESIST COMPOSITION NIPPON ZEON CO., LTD. (JP) 1997-07-30 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12625429-B2 Resist composition and pattern forming process NAF1, CLIC1, H1-4 ALDH1A1 1604/4885CYP19A1 4182/4885TSHR 455/4885
US-12596303-B2 Resist composition and pattern forming process CBR1, CCR1, NAF1 ALDH1A1 2963/4885CYP19A1 4355/4885TSHR 211/4885
US-12607933-B2 Polymer compositions having photoacid generators and photoresists PFAS, AFF1, HBG1 ALDH1A1 384/4885CYP19A1 1674/4885TSHR 1184/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.