SCHEMBL6932133

SCHEMBL6932133

[CH2]CCC(=O)CC[CH2]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11041667 0.96 ACE (0.36)
SCHEMBL7198148 0.85
SCHEMBL9227938 0.84
SCHEMBL127466 0.84
SCHEMBL6976745 0.82
SCHEMBL7426321 0.82 MAPT (0.41)
SCHEMBL9864154 0.82 ALDH1A1 (0.56)
SCHEMBL1412938 0.80
SCHEMBL6032277 0.80 GPR84 (0.46)
SCHEMBL9219475 0.79

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-4551382-A POLYESTERURETHANE AND ACRYLIC OR VINYL POLYMER RHONE-POULENC SPECIALITES CHIMIQUES (FR) 1985-11-05 US claimed
US-4150946-A ABRASION RESISTANT TEXTILES RHONE-POULENC INDUSTRIES (FR) 1979-04-24 US claimed
CN-111278896-A Thermosetting resin composition and method for producing same 堺化学工业株式会社 2020-06-12 CN disclosed
EP-0894780-B1 Use of radiation-curable compositions for coating mineral bodies BASF AG (DE) 2003-11-26 EP disclosed
US-6602647-B2 Photo acid generator with high transparency and excellent heat stability in a photoresist for lithography using far ultraviolet light, especially light of ArF excimer consists of a cyclic sulfonium compound with 2-oxo group NEC CORPORATION (JP) 2003-08-05 US disclosed
US-20020045122-A1 Sulfonium salt compound and resist composition and pattern forming method using the same NEC CORPORATION 2002-04-18 US disclosed
EP-1113334-A1 Sulfonium salt compound, resist composition comprising the same and pattern forming method using the composition NEC CORPORATION (JP) 2001-07-04 EP disclosed
US-6136383-A UV RADIATION OR ELECTRON BEAMS CURING THE COATINGS COMPRISING AT LEAST ONE POLYMER WHICH HAS ETHYLENICALLY UNSATURATED DOUBLE BONDS; PREVENT EFFLORESCENCE AND WEATHERPROOFING BASF AKTIENGESELLSCHAFT (DE) 2000-10-24 US disclosed
EP-0894780-A1 Use of radiation-curable compositions for coating mineral bodies BASF AKTIENGESELLSCHAFT (DE) 1999-02-03 EP disclosed
US-4150946-A ABRASION RESISTANT TEXTILES RHONE-POULENC INDUSTRIES (FR) 1979-04-24 US disclosed