SCHEMBL6932778

SCHEMBL6932778

Cc1cc(C)c(S(=O)(=O)C(=[N+]=[N-])S(=O)(=O)c2c(C)cc(C)cc2C)c(C)c1

nearest known ligand 0.47

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.47
CA2 P00918 1/20 0.47
MMP1 P03956 1/20 0.47
MMP2 P08253 1/20 0.47
MMP9 P14780 1/20 0.47
MMP8 P22894 1/20 0.47
MMP13 P45452 1/20 0.47
F2 P00734 3/20 0.43
PRSS1 P07477 3/20 0.43
PRSS2 P07478 3/20 0.43
PRSS3 P35030 3/20 0.43
RAPGEF4 Q8WZA2 6/20 0.42
GAA P10253 2/20 0.39
POLB P06746 1/20 0.39
TSHR P16473 1/20 0.39
GFER P55789 1/20 0.39
NPSR1 Q6W5P4 1/20 0.37
CYTH2 Q99418 1/20 0.37
MAPT P10636 2/20 0.36
RAB9A P51151 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3181053 0.87 FFAR4 (0.44) CA1CA2MMP1MMP2MMP9
SCHEMBL3165992 0.87 RAPGEF4 (0.40) CA1CA2MMP1MMP2MMP9
SCHEMBL30457792 0.87 RAPGEF4 (0.40) CA1CA2MMP1MMP2MMP9
SCHEMBL3170266 0.82 EPHX2 (0.37) CA1CA2MMP1MMP2MMP9
SCHEMBL3175052 0.81 EPHX2 (0.38) CA1CA2MMP1MMP2MMP9
SCHEMBL28283234 0.81 CA1 (0.36) CA1CA2MMP1MMP2MMP9
SCHEMBL28218865 0.78 SLC1A3 (0.33) CA1CA2MMP1MMP2MMP9
SCHEMBL36946 0.76 RAPGEF4 (0.44) F2RAPGEF4GAAPOLBGFER
SCHEMBL29362738 0.76 RAPGEF4 (0.44) F2RAPGEF4GAAPOLBGFER
SCHEMBL21117640 0.72 CA1 (0.52) CA1CA2MMP1MMP2MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11762127-B2 Antireflective film including a photoresist material containing a polymer compound having an aromatic group, method of producing antireflective film, and eyeglass type display SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-19 US disclosed
US-6589705-B1 Positive-working photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-07-08 US disclosed
US-6555289-B2 Positive photoresist composition comprises a resin having a specific silicon-containing group on the side chain, the solubility of which resin in an akali developer increases under action of an acid FUJI PHOTO FILM CO., LTD. (JP) 2003-04-29 US disclosed
US-6528229-B2 Mixture of polymer and acid generators FUJI PHOTO FILM CO., LTD. (JP) 2003-03-04 US disclosed
US-6506535-B1 A positive working photoresist composition for use in the production of semiconductor integrated circuit devices, mask for the production of integrated circuits, printed wiring boards, liquid crystal panels FUJI PHOTO FILM CO., LTD. (JP) 2003-01-14 US disclosed
US-20020048720-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2002-04-25 US disclosed
US-20010041303-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2001-11-15 US disclosed
EP-1096319-A1 Positive-working photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 2001-05-02 EP disclosed