SCHEMBL707650

SCHEMBL707650

CC(C)(C)[SiH](OCCCc1ccccc1)C(C)(C)C

nearest known ligand 0.50

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 1/20 0.50
LMNA P02545 1/20 0.43
MEN1 O00255 2/20 0.40
KMT2A Q03164 2/20 0.40
L3MBTL1 Q9Y468 1/20 0.40
POLB P06746 1/20 0.40
SIGMAR1 Q99720 2/20 0.40
MAOA P21397 1/20 0.39
FFAR1 O14842 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL703823 0.95 IDO1 (0.44) IDO1L3MBTL1SIGMAR1MAOAFFAR1
SCHEMBL703504 0.89 CA1 (0.40) IDO1
SCHEMBL104984 0.79 IDO1 (0.55) IDO1LMNAMEN1KMT2AL3MBTL1
SCHEMBL702697 0.76 TSHR (0.46) IDO1LMNAL3MBTL1
SCHEMBL706647 0.76 IDO1 (0.52) IDO1LMNAMEN1KMT2AL3MBTL1
SCHEMBL14498980 0.75 IDO1 (0.55) IDO1LMNAMEN1KMT2AL3MBTL1
SCHEMBL702620 0.74 IDO1 (0.50) IDO1LMNAL3MBTL1SIGMAR1
SCHEMBL104848 0.73 IDO1 (0.48) IDO1L3MBTL1SIGMAR1MAOAFFAR1
SCHEMBL708505 0.73 IDO1 (0.48) IDO1LMNAL3MBTL1SIGMAR1
SCHEMBL19809436 0.73 IDO1 (0.48) IDO1LMNASIGMAR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed