Triaziquone

Triaziquone

SCHEMBL7117809

CNC.O=C1C=C(N2CC2)C(=O)C(N2CC2)=C1N1CC1

nearest known ligand 0.44

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MAPT P10636 3/20 0.44
HTT P42858 2/20 0.44
TP53 P04637 1/20 0.44
STAT3 P40763 1/20 0.44
SMN1; SMN2 Q16637 1/20 0.44
DNMT1 P26358 1/20 0.43
NSD2 O96028 4/20 0.36
TDP2 O95551 3/20 0.36
APAF1 O14727 2/20 0.36
HKDC1 Q2TB90 2/20 0.36
KMT2A Q03164 2/20 0.34
ATG4B Q9Y4P1 2/20 0.34
LMNA P02545 2/20 0.34
MEN1 O00255 1/20 0.34
NPC1 O15118 1/20 0.34
RAB9A P51151 1/20 0.34
GALK1 P51570 1/20 0.34
BLM P54132 1/20 0.34
ATM Q13315 1/20 0.34
NOD2 Q9HC29 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Triaziquone SCHEMBL8974524 0.92 MAPT (0.42) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL9794506 0.92 MAPT (0.42) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL10440466 0.92 MAPT (0.42) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL8303 0.92 DNMT1 (0.48) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL1546343 0.91 MAPT (0.41) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL149876 0.90 MAPT (0.46) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL7783197 0.90 MAPT (0.46) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL8993238 0.90 DNMT1 (0.47) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL8482641 0.90 DNMT1 (0.47) MAPTHTTTP53STAT3SMN1; SMN2
Triaziquone SCHEMBL6000230 0.90 DNMT1 (0.47) MAPTHTTTP53STAT3SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 17 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117023630-A Preparation method of gallium oxide nano-sheet and electrode sheet 东莞意可新材料有限公司 2023-11-10 CN claimed
EP-2297379-B1 METHODS OF PRODUCING HIGH-K DIELECTRIC FILMS USING CERIUM-BASED ß-DIKETONATE PRECURSORS SIGMA ALDRICH CO LLC (US) 2019-04-17 EP claimed
US-20020115886-A1 Tantalum tertiary amylimido tris (dimethylamide), a process for producing the same, a solution of starting material for MOCVD using the same, and a method of forming a tantalum nitride film using the same KABUSHIKIKAISHA KOJUNDOKOKAGAKU KENKYUSHO (JP) 2002-08-22 US claimed
CN-1205557-A Process for producing thin films of oxide ceramic SIEMENS AG (DE) 1999-01-20 CN claimed
CN-117023630-A Preparation method of gallium oxide nano-sheet and electrode sheet 东莞意可新材料有限公司 2023-11-10 CN disclosed
CN-117023630-A Preparation method of gallium oxide nano-sheet and electrode sheet 东莞意可新材料有限公司 2023-11-10 CN disclosed
CN-115735266-A Titanium complex, method for producing same, and method for producing titanium-containing thin film 东曹株式会社 2023-03-03 CN disclosed
CN-114381711-A Method of forming a structure for threshold voltage control ASM IP私人控股有限公司 2022-04-22 CN disclosed
CN-111933668-A Semiconductor device with a plurality of semiconductor chips 株式会社半导体能源研究所 2020-11-13 CN disclosed
CN-105849875-B Semiconductor device and method for manufacturing the same 株式会社半导体能源研究所 2020-03-06 CN disclosed
EP-0966553-B1 PROCESS FOR LOW TEMPERATURE CVD USING BI-AMIDES INFINEON TECHNOLOGIES AG (DE) 2004-03-24 EP disclosed
US-6593484-B2 Forming tantalum nitride film as barrier film by chemical vapor deposition KABUSHIKIKAISHA KOJUNDOKAGAKU KENKYUSHO (JP) 2003-07-15 US disclosed
US-20020115886-A1 Tantalum tertiary amylimido tris (dimethylamide), a process for producing the same, a solution of starting material for MOCVD using the same, and a method of forming a tantalum nitride film using the same KABUSHIKIKAISHA KOJUNDOKOKAGAKU KENKYUSHO (JP) 2002-08-22 US disclosed
US-20020115886-A1 Tantalum tertiary amylimido tris (dimethylamide), a process for producing the same, a solution of starting material for MOCVD using the same, and a method of forming a tantalum nitride film using the same KABUSHIKIKAISHA KOJUNDOKOKAGAKU KENKYUSHO (JP) 2002-08-22 US disclosed
EP-0966553-A1 PROCESS FOR LOW TEMPERATURE CVD USING BI-AMIDES SIEMENS AKTIENGESELLSCHAFT (DE) 1999-12-29 EP disclosed
WO-1999029926-A1 PROCESS FOR LOW TEMPERATURE CVD USING BI AMIDES SIEMENS AKTIENGESELLSCHAFT (DE) 1999-06-17 WO disclosed
CN-1205557-A Process for producing thin films of oxide ceramic SIEMENS AG (DE) 1999-01-20 CN disclosed