Trolamine

Trolamine

SCHEMBL721955

CO.OCCN(CCO)CCO

nearest known ligand 0.50

Full drug profile on Sugi Atlas →

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
MAPT P10636 3/20 0.50
HPGD P15428 2/20 0.40
MAPK1 P28482 2/20 0.40
CYP1A2 P05177 1/20 0.40
CYP2C9 P11712 1/20 0.40
HIF1A Q16665 1/20 0.40
HSD17B10 Q99714 1/20 0.40
KDM4E B2RXH2 2/20 0.38
SMN1; SMN2 Q16637 2/20 0.38
ALOX15 P16050 1/20 0.38
ALDH1A1 P00352 2/20 0.33
HTT P42858 1/20 0.33
CA12 O43570 1/20 0.33
CA1 P00915 1/20 0.33
CA2 P00918 1/20 0.33
CA9 Q16790 1/20 0.33
BCHE P06276 1/20 0.32
ALDH2 P05091 1/20 0.32
TSHR P16473 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trolamine SCHEMBL27619468 0.96 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL28156459 0.92 MAPT (0.50) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL1146 0.91 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL4748243 0.91 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL434089 0.91 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL15845959 0.91 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL7210416 0.89 MAPT (0.42) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL8616286 0.89 MAPT (0.42) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL29234278 0.89 MAPT (0.42) MAPTHPGDMAPK1CYP1A2CYP2C9
Trolamine SCHEMBL11800024 0.88 MAPT (0.47) MAPTHPGDMAPK1CYP1A2CYP2C9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 44 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160252819-A1 MODIFIED-RESIST STRIPPER, METHOD FOR STRIPPING MODIFIED RESIST USING SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR-SUBSTRATE PRODUCT FUJIFILM CORPORATION (JP) 2016-09-01 US claimed
US-20060249482-A1 Chemical mechanical polishing compositions for step-ll copper line and other associated materials and method of using same ADVANCED TECHNOLOGY MATERIALS, INC. 2006-11-09 US claimed
US-20040108302-A1 Passivative chemical mechanical polishing composition for copper film planarization TRUIST BANK, AS NOTES COLLATERAL AGENT 2004-06-10 US claimed
US-5817610-A Non-corrosive cleaning composition for removing plasma etching residues OLIN MICROELECTRONIC CHEMICALS, INC. (US) 1998-10-06 US claimed
US-5780406-A MIXTURE OF HYDROXYLAMMONIUM SALT AND AMINE AND/OR QUATERNARY AMMONIUM HYDROXIDE; SEMICONDUCTORS FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 1998-07-14 US claimed
US-12276915-B2 Treatment liquid and treatment method FUJIFILM CORPORATION (JP) 2025-04-15 US disclosed
CN-118001774-A Method for coproducing alkane by preprocessing straws with ionic liquid 河南农业大学 2024-05-10 CN disclosed
CN-116713032-A Method for preparing methylation reaction catalyst and tetramethyl ammonium methyl carbonate 万华化学集团股份有限公司 2023-09-08 CN disclosed
CN-114367286-B Metal monoatomic catalyst and preparation method thereof 中国科学院地球环境研究所 2023-05-26 CN disclosed
CN-113198422-B Amino-functionalized halloysite porous microsphere-based gas adsorption material, and preparation method and application thereof 长安大学 2023-04-07 CN disclosed
CN-114367286-A Metal monatomic catalyst and preparation method thereof 中国科学院地球环境研究所 2022-04-19 CN disclosed
CN-113198422-A Amino-functionalized halloysite porous microsphere-based gas adsorption material, and preparation method and application thereof 长安大学 2021-08-03 CN disclosed
EP-0944708-B1 NON-CORROSIVE CLEANING COMPOSITION FOR REMOVING PLASMA ETCHING RESIDUES ARCH SPEC CHEM INC (US) 2003-01-02 EP disclosed
EP-1211564-A2 Non-corrosive cleaning composition for removing plasma etching residues ARCH SPECIALTY CHEMICALS, INC. (US) 2002-06-05 EP disclosed
EP-0829768-B1 Non-corrosive cleaning composition for removing plasma etching residues ARCH SPEC CHEM INC (US) 2002-03-06 EP disclosed
US-6020292-A Non-corrosive cleaning composition for removing plasma etching residues OLIN MICROELECTRONIC CHEMICALS, INC. (US) 2000-02-01 US disclosed
US-5817610-A Non-corrosive cleaning composition for removing plasma etching residues OLIN MICROELECTRONIC CHEMICALS, INC. (US) 1998-10-06 US disclosed
US-5780406-A MIXTURE OF HYDROXYLAMMONIUM SALT AND AMINE AND/OR QUATERNARY AMMONIUM HYDROXIDE; SEMICONDUCTORS FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 1998-07-14 US disclosed
EP-0829768-A1 Non-corrosive cleaning composition for removing plasma etching residues Olin Microelectronic Chemicals, Inc. (US) 1998-03-18 EP disclosed
US-4977109-A HEATING NITRATES TO GENERATE NITROGEN OXIDES,CALCINING INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (TW) 1990-12-11 US disclosed