SCHEMBL74951

SCHEMBL74951

C=C(C)C(=O)OC1(C)CC2CC1C1CCCC21

nearest known ligand 0.33

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.33
GAA P10253 1/20 0.33
MAPT P10636 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19881129 1.00 ALDH1A1 (0.33) ALDH1A1GAAMAPT
SCHEMBL10040357 0.97 ALDH1A1 (0.30) ALDH1A1GAAMAPT
SCHEMBL17829490 0.94 GABRP (0.32)
SCHEMBL14219529 0.87 ALDH1A1 (0.32) ALDH1A1GAAMAPT
SCHEMBL14523966 0.87 ALDH1A1 (0.32) ALDH1A1GAAMAPT
SCHEMBL4403804 0.86 ALDH1A1 (0.31) ALDH1A1GAAMAPT
SCHEMBL9609346 0.85 ALOX15 (0.36) ALDH1A1GAAMAPT
SCHEMBL4399250 0.84
SCHEMBL14523970 0.84 ALDH1A1 (0.30) ALDH1A1GAAMAPT
SCHEMBL13113310 0.83

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 571 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119866360-A Polymer composition and single layer phase difference material 日产化学株式会社 2025-04-22 CN disclosed
CN-119856108-A Liquid crystal aligning agent and liquid crystal display element 日产化学株式会社 2025-04-18 CN disclosed
EP-3616878-B1 EXTRUDED RESIN PLATE AND MANUFACTURING METHOD THEREOF KURARAY CO (JP) 2024-12-18 EP disclosed
CN-118302462-A Polymer composition and single layer phase difference material 日产化学株式会社 2024-07-05 CN disclosed
CN-118235084-A Liquid crystal aligning agent, liquid crystal alignment film and liquid crystal display element 日产化学株式会社 2024-06-21 CN disclosed
CN-117677669-A Polymer composition and single layer phase difference material 日产化学株式会社 2024-03-08 CN disclosed
US-20230305398-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-28 US disclosed
US-20230305398-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-28 US disclosed
CN-116601191-A Method for producing single-layer retardation film, and polymer composition for forming single-layer retardation film 日产化学株式会社 2023-08-15 CN disclosed
CN-116507968-A Radical generating film forming composition, radical generating film, method for manufacturing liquid crystal display element, and liquid crystal display element 日产化学株式会社 2023-07-28 CN disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
EP-1752479-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2007-02-14 EP disclosed
EP-1004568-B1 Novel ester compounds, polymers, resist compositions and patterning process SHINETSU CHEMICAL CO (JP) 2006-01-25 EP disclosed
CN-1234047-C Chemical amplification light resistance agent compsn. AMERICAN EVERBRIGHT CORP (US) 2005-12-28 CN disclosed
CN-1462909-A Chemical amplification light resistance agent compsn. AMERICAN EVERBRIGHT CORP (US) 2003-12-24 CN disclosed
US-6517994-B2 Amplified photoresist SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-02-11 US disclosed
US-6441115-B1 FOR USE AS CHEMICAL AMPLIFIED PHOTORESIST, COMPRISING UNITS DERIVED FROM (METH)ACRYLIC ACID, 2-ALKYL,5,6-(-(CH2)N-)NORBORN-2-YL ESTER WHERE N IS 2-6 EVERLIGHT USA, INC. 2002-08-27 US disclosed
US-6312867-B1 Ester compounds, polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-11-06 US disclosed
EP-1004568-A2 Novel ester compounds, polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2000-05-31 EP disclosed