SCHEMBL7523283

SCHEMBL7523283

Cc1cc(-c2cc(C)c(O)c(-c3cc(C)c(O)c(C)c3)c2O)cc(C)c1O

nearest known ligand 0.56

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.56
CA2 P00918 1/20 0.56
CYP1A2 P05177 2/20 0.43
CYP2C9 P11712 2/20 0.43
CYP2C19 P33261 1/20 0.43
MEN1 O00255 4/20 0.41
KMT2A Q03164 4/20 0.41
KDM4E B2RXH2 2/20 0.39
MAPT P10636 2/20 0.39
USP2 O75604 1/20 0.39
ACHE P22303 2/20 0.38
PTGS1 P23219 3/20 0.36
PTGS2 P35354 3/20 0.36
GAA P10253 2/20 0.36
ALDH1A1 P00352 2/20 0.36
ALOX5 P09917 2/20 0.36
HPGD P15428 1/20 0.36
RECQL P46063 1/20 0.36
G6PD P11413 1/20 0.36
L3MBTL1 Q9Y468 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5520610 0.84 CA1 (0.54) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL5526665 0.83 CA1 (0.52) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL8895164 0.80 CA1 (0.54) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL9571457 0.79 CA1 (0.59) CA1CA2CYP1A2CYP2C9CYP2C19
Ethane SCHEMBL28865517 0.77 CA1 (0.50) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL8043644 0.77 PDE4B (0.46) CA1CA2ACHEPTGS1PTGS2
SCHEMBL1224697 0.76 CA1 (0.62) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL29379546 0.75 CA1 (0.68) CA1CA2CYP1A2CYP2C9CYP2C19
Ethane SCHEMBL28219675 0.75 CA1 (0.48) CA1CA2CYP1A2CYP2C9CYP2C19
SCHEMBL3752346 0.74 CA1 (0.59) CA1CA2CYP1A2CYP2C9CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 23 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10162260-B2 Photosensitive resin composition, protective film, and liquid crystal display element CHI MEI CORPORATION (TW) 2018-12-25 US disclosed
US-20170168390-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM, AND LIQUID CRYSTAL DISPLAY ELEMENT CHI MEI CORPORATION (TW) 2017-06-15 US disclosed
US-9541832-B2 Photosensitive resin composition, protective film and element having the same CHI MEI CORPORATION (TW) 2017-01-10 US disclosed
US-9422446-B2 Photosensitive resin composition, protective film and element having the same CHI MEI CORPORATION (TW) 2016-08-23 US disclosed
US-9395627-B2 Positive photosensitive resin composition and method for forming pattern by using the same CHI MEI CORPORATION 2016-07-19 US disclosed
US-20150378256-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM AND ELEMENT HAVING THE SAME CHI MEI CORPORATION (TW) 2015-12-31 US disclosed
US-20150376355-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM AND ELEMENT HAVING THE SAME CHI MEI CORPORATION (TW) 2015-12-31 US disclosed
US-9190521-B2 Positive photosensitive resin composition and uses thereof CHI MEI CORPORATION (TW) 2015-11-17 US disclosed
US-8980506-B2 Photosensitive resin composition and application thereof CHI MEI CORPORATION (TW) 2015-03-17 US disclosed
US-20150072275-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERN BY USING THE SAME CHI MEI CORPORATION (TW) 2015-03-12 US disclosed
US-20130164461-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND USES THEREOF CHI MEI CORPORATION (TW) 2013-06-27 US disclosed
US-20120328799-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERNS BY USING THE SAME CHI MEI CORPORATION (TW) 2012-12-27 US disclosed
US-20120287393-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERNS BY USING THE SAME CHI MEI COOPERATION (TW) 2012-11-15 US disclosed
EP-0848289-B1 Negative-working chemical sensitization photoresist composition TOKYO OHKA KOGYO CO LTD (JP) 2002-02-27 EP disclosed
US-5928837-A Negative-working chemical-sensitization photoresist composition comprising oxime sulfonate compounds TOKYO OHKA KOGYO CO., LTD. (JP) 1999-07-27 US disclosed
EP-0848289-A1 Negative-working chemical sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1998-06-17 EP disclosed
US-5601961-A QUINONE DIAZIDE GROUP-CONTAINING COMPOUND AS PHOTOSENSITIZING AGENT, ALKALI-SOLUBLE RESINOUS INGREDIENT AS FILM-FORMING AGENT MADE FROM A BLEND OF AT LEAST TWO NOVOLAK-TYPE RESINS FROM M-AND P-CRESOL, A XYLENOL AND A TRIMETHYLPHENOL TOKYO OHKA KOGYO CO., LTD. (JP) 1997-02-11 US disclosed
US-5576138-A MIXTURE OF RESIN, PHOTOSENSITIZER AND BENZOPHENONE COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 1996-11-19 US disclosed
US-5501936-A IMPROVED RESOLUTION OF VERY FINE PATTERNS TOKYO OHKA KOGYO CO., LTD. (JP) 1996-03-26 US disclosed
US-5478692-A Fine patterning for electronics TOKYO OHKA KOGYO CO., LTD. (JP) 1995-12-26 US disclosed