SCHEMBL7569783

SCHEMBL7569783

O=C(O)OC(=O)C(=CC1CCCCCCCCCCC1)C(C1CCCCCCCCCCC1)(C1CCCCCCCCCCC1)C1CCCCCCCCCCC1

nearest known ligand 0.41

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
GRIK1 P39086 2/20 0.33
GRIK2 Q13002 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1533116 0.84 GRIK1 (0.40) GRIK1GRIK2
SCHEMBL1263148 0.84 GRIK1 (0.40) GRIK1GRIK2
SCHEMBL15410424 0.83 GRIK1 (0.39) GRIK1GRIK2
SCHEMBL651537 0.77
SCHEMBL6413151 0.71 GRIK1 (0.38) GRIK1GRIK2
SCHEMBL704502 0.70 HTT (0.33)
SCHEMBL7988774 0.70 KEAP1 (0.32)
SCHEMBL15228 0.68 GRIK1 (0.41) GRIK1GRIK2
SCHEMBL10592905 0.68 GRIK1 (0.41) GRIK1GRIK2
SCHEMBL694029 0.68 GRIK1 (0.41) GRIK1GRIK2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6406831-B1 AN PHOTOACID GENERATOR WHICH RELEASES AN ACID BY EXPOSURE TO LIGHT, A VINYL POLYMER WHICH IS ACID SENSITIVE AND HAS AN ALKALI SOLUBLE GROUP PROTECTED WITH A DISSOLUTION CONTROLLING GROUP AND CONVERTED INTO ALKALI SOLUBLE RESIN BY ACID CLEAVAGE NEC CORPORATION (JP) 2002-06-18 US disclosed
US-20020058203-A1 Chemically amplified resist compositions NEC ELECTRONICS CORPORATION (JP) 2002-05-16 US disclosed
US-20020042018-A1 Positive chemically amplified resist and method for forming its pattern NEC CORPORATION 2002-04-11 US disclosed
US-6342334-B1 ULTRAFINE PROCESSING WITH IMPROVED FOCAL DEPTH, DICARBOXYIMIDE PHOTOACID GENERATOR WHICH RELEASES AN ACID HAVING BOTH A SULFONIC ACID GROUP AND A CARBOXYL GROUP; ACID SENSITIVE RESIN WHICH FORMS A CARBOXYL-CONTAINING ALKALI SOLUBLE RESIN; NEC CORPORATION (JP) 2002-01-29 US disclosed
US-6106998-A PHOTORESISTS SUITABLE FOR USE IN PHOTOLITHOGRAPHY THAT EMPLOYS AN ARF EXCIMER LASER; HIGH TRANSPARENCY TO EXPOSURE LIGHT HAVING A WAVELENGTH OF 220 NM OR LESS AND DRY-ETCH RESISTANCE NEC CORPORATION (JP) 2000-08-22 US disclosed
US-5985522-A PATTERN PHOTORESISTS, EXPOSURE TO LIGHT, DEVELOPMENT OF METHACRYLATE POLYMERS NEC CORPORATION (JP) 1999-11-16 US disclosed
US-5770346-A BRIDGED CYCLIC HYDROCARBON GROUP-CONTAINING ACRYLATE POLYMER NEC CORPORATION (JP) 1998-06-23 US disclosed