SCHEMBL7934193

SCHEMBL7934193

COC(C)(C)[SiH3]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL767438 0.76
SCHEMBL3888380 0.70 ALDH1A1 (0.40)
Methylamine SCHEMBL16192060 0.70
SCHEMBL14895494 0.70 ALDH1A1 (0.40)
SCHEMBL5412519 0.70 ALDH1A1 (0.40)
SCHEMBL3988458 0.70
SCHEMBL115919 0.70
SCHEMBL8415492 0.68 ALDH1A1 (0.38)
SCHEMBL503396 0.67
SCHEMBL8679785 0.67 ALDH1A1 (1.00)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2025264567-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS, INC. (US) 2025-12-26 WO claimed
US-20250391656-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS INC (US) 2025-12-25 US claimed
US-20250357107-A1 RF PULSING ASSISTED LOW-K MATERIAL DEPOSITION WITH HIGH DENSITY APPLIED MATERIALS, INC. (US) 2025-11-20 US claimed
WO-2025049147-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-03-06 WO claimed
US-20250069884-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-27 US claimed
WO-2025038375-A1 METHODS FOR FORMING LOW-Κ DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND INCREASED DENSITY APPLIED MATERIALS, INC. (US) 2025-02-20 WO claimed
WO-2024238097-A1 METHODS FOR FORMING LOW-Κ DIELECTRIC MATERIALS WITH INCREASED ETCH SELECTIVITY APPLIED MATERIALS, INC. (US) 2024-11-21 WO claimed
WO-2024226342-A1 METHODS FOR FORMING LOW-Κ DIELECTRIC MATERIALS APPLIED MATERIALS, INC. (US) 2024-10-31 WO claimed
US-20260018409-A1 POST TREATMENT PROCESSES APPLIED MATERIALS INC (US) 2026-01-15 US disclosed
WO-2025264567-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS, INC. (US) 2025-12-26 WO disclosed
US-20250391656-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS INC (US) 2025-12-25 US disclosed
US-20250369102-A1 LOWER K AND HIGHER HARDNESS WITH IMPROVED PLASMA INDUCED DAMAGE (PID) DIELECTRIC FILM DEPOSITION APPLIED MATERIALS INC (US) 2025-12-04 US disclosed
US-20250357107-A1 RF PULSING ASSISTED LOW-K MATERIAL DEPOSITION WITH HIGH DENSITY APPLIED MATERIALS, INC. (US) 2025-11-20 US disclosed
WO-2025049147-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-03-06 WO disclosed
WO-2024044459-A1 ADHESION IMPROVEMENT BETWEEN LOW-K MATERIALS AND CAP LAYERS APPLIED MATERIALS, INC. (US) 2024-02-29 WO disclosed
US-20240071817-A1 ADHESION IMPROVEMENT BETWEEN LOW-K MATERIALS AND CAP LAYERS APPLIED MATERIALS, INC. (US) 2024-02-29 US disclosed
US-6232261-B1 REACTION PRODUCT OF AN ALUMINOXANE OR PRODUCT OF AN ALKYLALUMINUM AND WATER WITH A SILICON-CONTAINING COMPOUND, FOR EXAMPLE DIPHENYLSILANE DIOL; OLEFIN POLYMERIZATION CATALYST, ESPECIALLY A METALLOCENE COMPLEX BP CHEMICALS LIMITED (GB) 2001-05-15 US disclosed
JP-2000019744-A RELEASE AGENT COMPOSITION KAO CORP 2000-01-21 JP disclosed
EP-0952991-A1 CATALYST ACTIVATORS BP Chemicals Limited (GB) 1999-11-03 EP disclosed
WO-1998031715-A1 CATALYST ACTIVATORS BP CHEMICALS LIMITED (GB) 1998-07-23 WO disclosed