SCHEMBL7941971

SCHEMBL7941971

C1CCC(OB(OC2CCCC2)OC2CCCC2)C1

nearest known ligand 0.32

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
CA1 P00915 3/20 0.32
CA2 P00918 3/20 0.32
CA12 O43570 2/20 0.32
CA9 Q16790 2/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL51373 0.97 CA1 (0.36) CA1CA2CA12CA9
SCHEMBL29212225 0.97 CA1 (0.36) CA1CA2CA12CA9
SCHEMBL29212226 0.97 CA1 (0.36) CA1CA2CA12CA9
SCHEMBL3673090 0.97 CA1 (0.36) CA1CA2CA12CA9
SCHEMBL833964 0.85
SCHEMBL3898721 0.82
SCHEMBL13203294 0.80 ALDH1A1 (0.42)
SCHEMBL9861657 0.80 ACHE (0.31) CA1CA2CA12CA9
SCHEMBL17014988 0.76 CA1 (0.36) CA1CA2CA12CA9
SCHEMBL3889052 0.76 CA1 (0.42) CA1CA2CA12CA9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 31 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11733609-B2 Silicon-containing underlayers ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2023-08-22 US disclosed
US-11542397-B2 Liquid composition, quantum dot-containing film, optical film, light-emitting display element panel, and light-emitting display device TOKYO OHKA KOGYO CO., LTD. (JP) 2023-01-03 US disclosed
US-20220389308-A1 WAVELENGTH CONVERSION FILM, WAVELENGTH CONVERSION FILM FORMING COMPOSITION, AND CLUSTER-CONTAINING QUANTUM DOT PRODUCTION METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2022-12-08 US disclosed
US-11413682-B2 Method for producing surface-modified metal oxide fine particle, method for producing improved metal oxide fine particles, surface-modified metal oxide fine particles, and metal oxide fine particle dispersion liquid TOKYO OHKA KOGYO CO., LTD. (JP) 2022-08-16 US disclosed
US-11360387-B2 Silicon-containing underlayers ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2022-06-14 US disclosed
EP-3998324-A1 WAVELENGTH CONVERSION FILM, WAVELENGTH CONVERSION FILM FORMING COMPOSITION, AND CLUSTER-CONTAINING QUANTUM DOT PRODUCTION METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2022-05-18 EP disclosed
US-20220073817-A1 METHOD FOR PRODUCING QUANTUM DOT-CONTAINING FILM AND COMPOSITION FOR PRODUCING QUANTUM DOT-CONTAINING FILM TOKYO OHKA KOGYO CO., LTD. (JP) 2022-03-10 US disclosed
CN-114127228-A Wavelength conversion film, composition for forming wavelength conversion film, and method for producing cluster-containing quantum dot 东京应化工业株式会社 2022-03-01 CN disclosed
CN-108250754-B Silicon-containing resin composition, silicon-containing resin film, silica film, light-emitting display element panel, and light-emitting display device 东京应化工业株式会社 2022-01-25 CN disclosed
US-20210397093-A1 SILICON-CONTAINING UNDERLAYERS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2021-12-23 US disclosed
US-9627204-B2 Composition for forming a coating type BPSG film, substrate formed a film by said composition, and patterning process using said composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-04-18 US disclosed
US-9580623-B2 Patterning process using a boron phosphorus silicon glass film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-02-28 US disclosed
US-20160276152-A1 PATTERNING PROCESS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2016-09-22 US disclosed
US-20160096978-A1 COMPOSITION FOR FORMING A COATING TYPE BPSG FILM, SUBSTRATE, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-07 US disclosed
US-20160096977-A1 COMPOSITION FOR FORMING A COATING TYPE SILICON-CONTAINING FILM, SUBSTRATE, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-07 US disclosed
EP-2826826-A1 Composition for forming a coating type BPSG film, substrate formed a film by said composition, and patterning process using said composition Shin-Etsu Chemical Co., Ltd. (JP) 2015-01-21 EP disclosed
US-20150004791-A1 COMPOSITION FOR FORMING A COATING TYPE BPSG FILM, SUBSTRATE FORMED A FILM BY SAID COMPOSITION, AND PATTERNING PROCESS USING SAID COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-01-01 US disclosed
US-6248265-B1 Clean generation of a fluoroaryl grignard reagent ALBEMARLE CORPORATION 2001-06-19 US disclosed
US-5382617-A Heat resistant polymers with boron oxide E. I. DU PONT DE NEMOURS AND COMPANY (US) 1995-01-17 US disclosed
US-4092465-A PRESSURE SENSITIVE, IMPROVED CREEP RESISTANCE PHILLIPS PETROLEUM COMPANY (US) 1978-05-30 US disclosed