SCHEMBL7992906

SCHEMBL7992906

CC(C)(C)OC(=O)Oc1cccc(C=O)c1

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
POLB P06746 2/20 0.50
ALDH1A1 P00352 1/20 0.50
ELANE P08246 1/20 0.49
NPC1 O15118 4/20 0.48
RAB9A P51151 3/20 0.48
KMT2A Q03164 2/20 0.48
GAA P10253 1/20 0.48
MAPT P10636 1/20 0.48
HPGD P15428 1/20 0.48
SMN1; SMN2 Q16637 1/20 0.48
SRC P12931 1/20 0.47
MEN1 O00255 1/20 0.47
BLM P54132 1/20 0.47
MCL1 Q07820 1/20 0.47
L3MBTL1 Q9Y468 1/20 0.47
MAOA P21397 7/20 0.42
MAOB P27338 7/20 0.42
TDP1 Q9NUW8 1/20 0.41
UNG P13051 1/20 0.41
CYP3A4 P08684 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9313699 0.91 POLB (0.46) POLBALDH1A1ELANENPC1RAB9A
SCHEMBL16959815 0.88 ELANE (0.49) POLBALDH1A1ELANENPC1RAB9A
SCHEMBL2472047 0.86 ELANE (0.47) POLBALDH1A1ELANENPC1RAB9A
SCHEMBL8579838 0.85 SRC (0.58) POLBALDH1A1NPC1RAB9AKMT2A
SCHEMBL13845254 0.83 ELANE (0.51) POLBALDH1A1ELANENPC1KMT2A
SCHEMBL31738388 0.82 SRC (0.54) POLBALDH1A1NPC1RAB9AKMT2A
SCHEMBL1035304 0.81 POLB (0.52) POLBALDH1A1ELANENPC1RAB9A
SCHEMBL6392035 0.80 CYP3A4 (0.62) POLBALDH1A1ELANEKMT2AMEN1
SCHEMBL2761992 0.80 ELANE (0.64) ALDH1A1ELANENPC1RAB9AKMT2A
SCHEMBL2441567 0.79 FBP1 (0.48) POLBALDH1A1NPC1RAB9AKMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6277546-B1 Process for imaging of photoresist INTERNATIONAL BUSINESS MACHINES CORPORATION 2001-08-21 US disclosed
EP-0652488-B1 Resist materials and related processes AT & T CORP (US) 1999-05-19 EP disclosed
EP-0596668-B1 Process for imaging of photoresist IBM (US) 1999-04-14 EP disclosed
US-5741629-A POLYMER CONTAINING SUBSTITUTED STYRENE MONOMERS LUCENT TECHNOLOGIES INC. (US) 1998-04-21 US disclosed
EP-0525626-B1 Compounds containing acid-cleavable protective groups and positive-working radiation-sensitive compositions prepared using these compounds HOECHST AG (DE) 1995-06-14 EP disclosed
EP-0652488-A2 Resist materials and related processes AT&T Corp. (US) 1995-05-10 EP disclosed
US-5356752-A Compounds with acid-labile protective groups useful in positive-working radiation-sensitive mixtures HOECHST AKTIENGESELLSCHAFT (DE) 1994-10-18 US disclosed
EP-0596668-A2 Process for imaging of photoresist International Business Machines Corporation (US) 1994-05-11 EP disclosed
EP-0525626-A1 Compounds containing acid-cleavable protective groups and positive-working radiation-sensitive compositions prepared using these compounds HOECHST AKTIENGESELLSCHAFT (DE) 1993-02-03 EP disclosed