SCHEMBL8153459

SCHEMBL8153459

C=CC(=O)C(=O)CC[Si](OC)(OC)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10705114 0.82 TSHR (0.31)
SCHEMBL8155361 0.82 ALDH1A1 (0.32)
SCHEMBL2526183 0.79 ALDH1A1 (0.41)
SCHEMBL6911076 0.78
SCHEMBL2519828 0.75 ALDH1A1 (0.36)
SCHEMBL762567 0.72 TSHR (0.38)
SCHEMBL421091 0.72 ALDH1A1 (0.33)
SCHEMBL8156378 0.71
Acrylic Acid SCHEMBL29165216 0.69 LMNA (0.42)
Acrylic Acid SCHEMBL15876790 0.69 LMNA (0.42)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12360451-B2 Method of manufacturing semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2025-07-15 US disclosed
US-20250149336-A1 PHOTORESIST COMPOSITION AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE USING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2025-05-08 US disclosed
US-20240302742-A1 PHOTORESIST COMPOSITION INCLUDING PHOTOSENSITIVE POLYMER AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-09-12 US disclosed
WO-2023242193-A1 THERMALLY CONDUCTIVE SILICONE COMPOSITION AND METHOD FOR PRODUCING THERMALLY CONDUCTIVE MEMBER USING THE COMPOSITION WACKER CHEMIE AG (DE) 2023-12-21 WO disclosed
US-20230288806-A1 PHOTOSENSITIVE POLYMER CAPABLE OF MULTI-STEP DEPROTECTION REACTION, PHOTORESIST COMPOSITION INCLUDING THE PHOTOSENSITIVE POLYMER, AND METHOD OF MANUFACTURING THE INTEGRATED CIRCUIT DEVICE SAMSUNG ELECTRONICS CO., LTD. (KR) 2023-09-14 US disclosed
US-20220299874-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INHA INDUSTRY PARTNERSHIP INSTITUTE (KR) 2022-09-22 US disclosed
US-20220252982-A1 PHOTORESIST COMPOSITIONS AND METHODS OF MANUFACTURING INTEGRATED CIRCUIT DEVICE USING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2022-08-11 US disclosed
US-20220252976-A1 PHOTORESIST COMPOSITIONS AND METHODS OF MANUFACTURING INTEGRATED CIRCUIT DEVICE USING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2022-08-11 US disclosed
US-20210380612-A1 PHOTORESIST COMPOSITIONS SAMSUNG ELECTRONICS CO., LTD. (KR) 2021-12-09 US disclosed
US-9389339-B2 Method for producing antireflection film, antireflection film, and coating composition FUJIFILM CORPORATION (JP) 2016-07-12 US disclosed
US-20160184789-A1 MICROCHEMICAL CHIP AND REACTION DEVICE ASAHI FR R&D CO., LTD. (JP) 2016-06-30 US disclosed
US-20160187540-A2 METHOD FOR PRODUCING ANTIREFLECTION FILM, ANTIREFLECTION FILM, AND COATING COMPOSITION FUJIFILM CORPORATION (JP) 2016-06-30 US disclosed
CN-105517970-A Optical fiber coating for short data network CORNING INC 2016-04-20 CN disclosed
US-20120270021-A1 METHOD FOR PRODUCING ANTIREFLECTION FILM, ANTIREFLECTION FILM, AND COATING COMPOSITION FUJIFILM CORPORATION (JP) 2012-10-25 US disclosed
EP-0708143-B1 Polyvinyl chloride based resin composition and products derived therefrom SEKISUI AMERICA CORP (US) 2000-01-05 EP disclosed
EP-0708143-A1 Polyvinyl chloride based resin composition and products derived therefrom SEKISUI AMERICA CORPORATION (US) 1996-04-24 EP disclosed