SCHEMBL906314

SCHEMBL906314

C=C(C(=O)OCC(F)(F)C(F)(F)F)c1ccccc1

nearest known ligand 0.48

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TDP1 Q9NUW8 5/20 0.44
ATM Q13315 1/20 0.44
MAPK1 P28482 4/20 0.42
HIF1A Q16665 1/20 0.42
ALDH1A1 P00352 3/20 0.41
MAPT P10636 3/20 0.41
CES1 P23141 2/20 0.39
POLB P06746 2/20 0.38
NPSR1 Q6W5P4 2/20 0.38
SLC6A3 Q01959 2/20 0.35
KMT2A Q03164 2/20 0.35
SLC6A2 P23975 1/20 0.35
LMNA P02545 3/20 0.34
F2 P00734 2/20 0.34
ELANE P08246 2/20 0.34
PLAU P00749 1/20 0.34
HTR1A P08908 1/20 0.33
CYP2D6 P10635 1/20 0.33
SCN1A P35498 1/20 0.33
SCN5A Q14524 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL906344 0.87 TDP1 (0.46) TDP1ATMMAPK1HIF1AALDH1A1
SCHEMBL8858245 0.80 TDP1 (0.54) TDP1ATMMAPK1HIF1AALDH1A1
SCHEMBL4908891 0.80 TDP1 (0.54) TDP1ATMMAPK1HIF1AALDH1A1
SCHEMBL1993609 0.80 MAPK1 (0.67) TDP1MAPK1HIF1AALDH1A1CES1
SCHEMBL906233 0.78 CES1 (0.45) MAPK1ALDH1A1CES1KMT2AMEN1
SCHEMBL27298398 0.75 TDP1 (0.47) TDP1ATMMAPK1HIF1AALDH1A1
SCHEMBL22319226 0.75 ATM (0.38) TDP1ATMMAPK1HIF1AALDH1A1
Styrene SCHEMBL10606293 0.75 MAPK1 (0.37) TDP1ATMMAPK1HIF1AALDH1A1
SCHEMBL316956 0.74 ALDH1A1 (0.69) TDP1ATMALDH1A1MAPTKMT2A
SCHEMBL27952988 0.74 TDP1 (0.46) TDP1ATMMAPK1HIF1AALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1708027-B1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORP (JP) 2019-03-13 EP disclosed
US-9182674-B2 Immersion upper layer film forming composition and method of forming photoresist pattern JSR CORPORATION (JP) 2015-11-10 US disclosed
EP-2468780-B1 Copolymer and top coating composition JSR CORP (JP) 2013-11-13 EP disclosed
US-8580482-B2 Copolymer and top coating composition JSR CORPORATION (JP) 2013-11-12 US disclosed
EP-1806370-B1 COPOLYMER AND UPPER FILM-FORMING COMPOSITION JSR CORP (JP) 2013-05-22 EP disclosed
EP-2277929-B1 Copolymer and top coating composition JSR CORP (JP) 2012-11-21 EP disclosed
US-20120282553-A1 IMMERSION UPPER LAYER FILM FORMING COMPOSITION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2012-11-08 US disclosed
EP-2315078-B1 Upper layer film forming composition for liquid immersion and method of forming photoresist pattern JSR CORP (JP) 2012-10-17 EP disclosed
EP-2468780-A1 Copolymer and top coating composition JSR Corporation (JP) 2012-06-27 EP disclosed
US-20120101205-A1 COPOLYMER AND TOP COATING COMPOSITION JSR CORPORATION (JP) 2012-04-26 US disclosed
US-7709182-B2 Composition for forming antireflection film, layered product, and method of forming resist pattern JSR CORPORATION (JP) 2010-05-04 US disclosed
US-20080124524-A1 Composition For Forming Antireflection Film, Layered Product, And Method Of Forming Resist Pattern JSR CORPORATION (JP) 2008-05-29 US disclosed
US-20080038661-A1 Copolymer and Top Coating Composition JSR CORPORATION (JP) 2008-02-14 US disclosed
US-20070269734-A1 Uper Layer Film Forming Composition for Liquid Immersion and Method of Forming Photoresist Pattern JSR CORPORATION (JP) 2007-11-22 US disclosed
EP-1818723-A1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR Corporation (JP) 2007-08-15 EP disclosed
EP-1806370-A1 COPOLYMER AND UPPER FILM-FORMING COMPOSITION JSR Corporation (JP) 2007-07-11 EP disclosed
EP-1708027-A1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2006-10-04 EP disclosed
EP-0583918-B1 Reflection preventing film and process for forming resist pattern using the same JAPAN SYNTHETIC RUBBER CO LTD (JP) 1999-03-10 EP disclosed
US-5410005-A Comprising acrylic amide and ester copolymers and their salts, having carboxyl and sulfonic acid groups as well as fluoro JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-04-25 US disclosed
EP-0583918-A2 Reflection preventing film and process for forming resist pattern using the same JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1994-02-23 EP disclosed