SCHEMBL906233

SCHEMBL906233

C=C(Cc1ccccc1)C(=O)OCC(F)(F)C(F)(F)F

nearest known ligand 0.45

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
CES1 P23141 2/20 0.45
ALDH1A1 P00352 3/20 0.40
MAPK1 P28482 1/20 0.40
L3MBTL1 Q9Y468 1/20 0.40
PAM P19021 1/20 0.39
CES2 O00748 1/20 0.39
AKR1B1 P15121 1/20 0.39
TXNRD1 Q16881 1/20 0.36
MEN1 O00255 2/20 0.35
KMT2A Q03164 2/20 0.35
HDAC8 Q9BY41 1/20 0.35
HDAC6 Q9UBN7 1/20 0.35
TSHR P16473 1/20 0.35
CRHBP P24387 1/20 0.35
CRHR2 Q13324 1/20 0.35
FNTA P49354 1/20 0.34
FNTB P49356 1/20 0.34
CNR2 P34972 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL906378 0.88 CES1 (0.47) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL906314 0.78 TDP1 (0.44) CES1ALDH1A1MAPK1MEN1KMT2A
SCHEMBL2833902 0.78 CES1 (0.50) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL6696083 0.77 ALDH1A1 (0.61) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL9116026 0.76 ALDH1A1 (0.46) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL394740 0.76 ALDH1A1 (0.56) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL9235730 0.76 ALDH1A1 (0.46) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL28073968 0.75 CES1 (0.39) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL27918597 0.75 CES1 (0.48) CES1ALDH1A1MAPK1L3MBTL1PAM
SCHEMBL28582716 0.75 CES1 (0.52) CES1ALDH1A1MAPK1L3MBTL1PAM

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1708027-B1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORP (JP) 2019-03-13 EP disclosed
US-9182674-B2 Immersion upper layer film forming composition and method of forming photoresist pattern JSR CORPORATION (JP) 2015-11-10 US disclosed
EP-2468780-B1 Copolymer and top coating composition JSR CORP (JP) 2013-11-13 EP disclosed
US-8580482-B2 Copolymer and top coating composition JSR CORPORATION (JP) 2013-11-12 US disclosed
EP-1806370-B1 COPOLYMER AND UPPER FILM-FORMING COMPOSITION JSR CORP (JP) 2013-05-22 EP disclosed
EP-2277929-B1 Copolymer and top coating composition JSR CORP (JP) 2012-11-21 EP disclosed
US-20120282553-A1 IMMERSION UPPER LAYER FILM FORMING COMPOSITION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2012-11-08 US disclosed
EP-2315078-B1 Upper layer film forming composition for liquid immersion and method of forming photoresist pattern JSR CORP (JP) 2012-10-17 EP disclosed
EP-2468780-A1 Copolymer and top coating composition JSR Corporation (JP) 2012-06-27 EP disclosed
US-20120101205-A1 COPOLYMER AND TOP COATING COMPOSITION JSR CORPORATION (JP) 2012-04-26 US disclosed
US-7709182-B2 Composition for forming antireflection film, layered product, and method of forming resist pattern JSR CORPORATION (JP) 2010-05-04 US disclosed
US-20080124524-A1 Composition For Forming Antireflection Film, Layered Product, And Method Of Forming Resist Pattern JSR CORPORATION (JP) 2008-05-29 US disclosed
US-20080038661-A1 Copolymer and Top Coating Composition JSR CORPORATION (JP) 2008-02-14 US disclosed
US-20070269734-A1 Uper Layer Film Forming Composition for Liquid Immersion and Method of Forming Photoresist Pattern JSR CORPORATION (JP) 2007-11-22 US disclosed
EP-1818723-A1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR Corporation (JP) 2007-08-15 EP disclosed
EP-1806370-A1 COPOLYMER AND UPPER FILM-FORMING COMPOSITION JSR Corporation (JP) 2007-07-11 EP disclosed
EP-1708027-A1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2006-10-04 EP disclosed
EP-0583918-B1 Reflection preventing film and process for forming resist pattern using the same JAPAN SYNTHETIC RUBBER CO LTD (JP) 1999-03-10 EP disclosed
US-5410005-A Comprising acrylic amide and ester copolymers and their salts, having carboxyl and sulfonic acid groups as well as fluoro JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-04-25 US disclosed
EP-0583918-A2 Reflection preventing film and process for forming resist pattern using the same JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1994-02-23 EP disclosed