SCHEMBL9304464

SCHEMBL9304464

CCCOc1c2ccccc2c(OCCC)c2cc(S(=O)(=O)OCc3ccc([N+](=O)[O-])cc3)ccc12

nearest known ligand 0.41

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.41
KMT2A Q03164 1/20 0.41
CA12 O43570 1/20 0.40
CA1 P00915 1/20 0.40
CA2 P00918 1/20 0.40
CA7 P43166 1/20 0.40
CA9 Q16790 1/20 0.40
HTR1A P08908 1/20 0.40
ADRA1D P25100 1/20 0.40
ADRA1A P35348 1/20 0.40
ADRA1B P35368 1/20 0.40
CYP19A1 P11511 10/20 0.39
LMNA P02545 1/20 0.38
MAOB P27338 2/20 0.37
MAOA P21397 1/20 0.37
IDO1 P14902 1/20 0.36
ALDH1A1 P00352 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12595121 0.95 MEN1 (0.42) MEN1KMT2ACA12CA1CA2
SCHEMBL1109650 0.91 MEN1 (0.42) MEN1KMT2ACA12CA1CA2
SCHEMBL31233774 0.91 MEN1 (0.42) MEN1KMT2ACA12CA1CA2
SCHEMBL335568 0.87 HTT (0.44) MEN1KMT2ACA12CA1CA2
SCHEMBL30139585 0.87 HTT (0.44) MEN1KMT2ACA12CA1CA2
SCHEMBL13367173 0.86 CA12 (0.38) MEN1KMT2ACA12CA1CA2
SCHEMBL13475516 0.84 MAOB (0.43) MEN1KMT2ACA12CA1CA2
SCHEMBL10403263 0.83 MAPT (0.40) MEN1KMT2ACA12CA9HTR1A
SCHEMBL8075081 0.80 S100A4 (0.45) MEN1KMT2ACA12CA1CA2
SCHEMBL28177879 0.78 CA1 (0.40) MEN1KMT2ACA12CA1CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 44 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-4963463-A Radiation-sensitive resin composition with admixtures of O-quinone diazide and acid esters having nitrobenzyl or cyanobenzyl group JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1990-10-16 US claimed
EP-0330406-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1989-08-30 EP claimed
EP-4146762-B1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE ON UNEVEN SURFACES DOW SILICONES CORP (US) 2024-05-08 EP disclosed
US-20240141210-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE ON UNEVEN SURFACES DOW CHEMICAL SILICONES KOREA, LTD. (KR) 2024-05-02 US disclosed
US-20230091861-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE IN PROTECTIVE FILMS FOR (OPTO)ELECTRONIC DEVICE FABRICATION DOW CHEMICAL SILICONES KOREA, LTD. (KR) 2023-03-23 US disclosed
EP-4146762-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE ON UNEVEN SURFACES Dow Silicones Corporation (US) 2023-03-15 EP disclosed
EP-4146761-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE IN PROTECTIVE FILMS FOR (OPTO)ELECTRONIC DEVICE FABRICATION Dow Silicones Corporation (US) 2023-03-15 EP disclosed
CN-115516056-A Silicone hybrid pressure sensitive adhesive, method of making the same, and method of use in protective films for (opto) electronic device manufacture 美国陶氏有机硅公司 2022-12-23 CN disclosed
CN-115485350-A Silicone hybrid pressure sensitive adhesives, methods of making and use on non-uniform surfaces 美国陶氏有机硅公司 2022-12-16 CN disclosed
WO-2021225675-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE ON UNEVEN SURFACES DOW SILICONS CORPORATION (US) 2021-11-11 WO disclosed
WO-2021225673-A1 SILICONE HYBRID PRESSURE SENSITIVE ADHESIVE AND METHODS FOR ITS PREPARATION AND USE IN PROTECTIVE FILMS FOR (OPTO)ELECTRONIC DEVICE FABRICATION DOW SILICONES CORPORATION (US) 2021-11-11 WO disclosed
US-20070138139-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, ACID ETCHING RESISTANCE MATERIAL AND COPOLYMER ASAKAWA KOJI 2007-06-21 US disclosed
US-20070138139-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, ACID ETCHING RESISTANCE MATERIAL AND COPOLYMER ASAKAWA KOJI 2007-06-21 US disclosed
US-20070101898-A1 Inkjet ink AKIYAMA RYOZO 2007-05-10 US disclosed
US-20070101898-A1 Inkjet ink AKIYAMA RYOZO 2007-05-10 US disclosed
US-7208334-B2 Method of manufacturing semiconductor device, acid etching resistance material and copolymer KABUSHIKI KAISHA TOSHIBA (JP) 2007-04-24 US disclosed
CN-1849355-A Photosensitive resin composition and film having cured coat formed therefrom NIPPON KAYAKU KK (JP) 2006-10-18 CN disclosed
US-5279923-A Generating an acid when exposured to actinic radiation HITACHI CHEMICAL COMPANY, LTD. (JP) 1994-01-18 US disclosed
US-4963463-A Radiation-sensitive resin composition with admixtures of O-quinone diazide and acid esters having nitrobenzyl or cyanobenzyl group JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1990-10-16 US disclosed
EP-0330406-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1989-08-30 EP disclosed