SCHEMBL93340

SCHEMBL93340

O=C(c1ccc(O)cc1)c1ccc(O)c(O)c1O

nearest known ligand 0.71

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HDAC1 Q13547 1/20 0.66
MAPT P10636 6/20 0.61
HPGD P15428 5/20 0.61
ALDH1A1 P00352 4/20 0.61
KDM4E B2RXH2 3/20 0.61
RECQL P46063 3/20 0.61
HSD17B10 Q99714 3/20 0.61
LMNA P02545 3/20 0.61
TDP1 Q9NUW8 2/20 0.61
MAPK1 P28482 2/20 0.61
CYP3A4 P08684 1/20 0.61
ALOX15 P16050 2/20 0.60
LIG1 P18858 1/20 0.57
ESR1 P03372 1/20 0.56
ESR2 Q92731 1/20 0.56
PKM P14618 1/20 0.56
HTT P42858 1/20 0.56
SELL P14151 1/20 0.54
SELP P16109 1/20 0.54
MEN1 O00255 4/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29366288 1.00 HDAC1 (0.66) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL3656665 0.94 HDAC1 (0.73) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL8861471 0.93 MEN1 (0.61) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL6568212 0.91 LIG1 (0.62) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL30063629 0.86 LIG1 (0.71) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL1947873 0.86 LIG1 (0.71) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL5689404 0.85 MEN1 (0.76) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL6568215 0.85 HDAC1 (0.58) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL28033673 0.85 MAPT (0.51) HDAC1MAPTHPGDALDH1A1KDM4E
SCHEMBL2053270 0.85 HDAC1 (0.58) HDAC1MAPTHPGDALDH1A1KDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2802 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230407114-A1 THREE-DIMENSIONAL PRINTING PERIDOT PRINT LLC 2023-12-21 US claimed
US-20230194984-A1 FLUORINE-CONTAINING RESIN COMPOSITION AND PREPARATION METHOD THEREOF, AND PREPARATION METHOD OF CURED FILM CONTAINING SAME XI'AN MANARECO NEW MATERIALS CO., LTD. (CN) 2023-06-22 US claimed
CN-115933334-A Positive photoresist capable of developing reverse trapezoidal morphology, and preparation method and application thereof 深圳市容大感光科技股份有限公司 2023-04-07 CN claimed
WO-2022115112-A1 THREE-DIMENSIONAL PRINTING HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. (US) 2022-06-02 WO claimed
CN-114478930-A Preparation method of polybutadiene latex and prepared ABS resin 万华化学集团股份有限公司 2022-05-13 CN claimed
CN-109824491-B Production method of 2,3,4, 4' -tetrahydroxybenzophenone 三峡大学 2022-03-08 CN claimed
CN-114137795-A Photoresist composition and application thereof 广东粤港澳大湾区黄埔材料研究院 2022-03-04 CN claimed
CN-114031736-A Modified phenolic resin for photoresist, preparation method thereof and photoresist composition 广东粤港澳大湾区黄埔材料研究院 2022-02-11 CN claimed
CN-113050376-A Photosensitive resin composition for photoresist 安徽邦铭新材料科技有限公司 2021-06-29 CN claimed
CN-112684661-A Photoresist composition and preparation method thereof 阜阳申邦新材料技术有限公司 2021-04-20 CN claimed
US-5080997-A PROCESS FOR PREPARING A POSITIVE RESIST COMPOSITION BY MIXING THE CONDENSATION PRODUCT OF A QUINONE DIAZIDE SULFONYL HALOGENIDE AND A PHENOL WITH A RESIN SOLUTION WITHOUT ISOLATING THE CONDENSATION PRODUCT FROM THE CRUDE MIXTURE SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1992-01-14 US claimed
US-5059507-A Which is sensitive to ultraviolet rays and x-rays SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1991-10-22 US claimed
EP-0434442-A2 Positive photoresist composition HOECHST CELANESE CORPORATION (US) 1991-06-26 EP claimed
EP-0415266-A2 Radiation-sensitive positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1991-03-06 EP claimed
US-4988601-A Novolak resins from 3,5-xylenol, m-cresol and/or p-cresol with a carbonyl compound and an o-quinonediazide photosensitizer or light sensitive elements KABUSHIKI KAISHA TOSHIBA (JP) 1991-01-29 US claimed
US-4985333-A PHOTORESISTS FOR SEMICONDUCTORS TOKYO OHKA KOGYO CO., LTD. (JP) 1991-01-15 US claimed
EP-0395346-A2 Photosensitive composition Fuji Photo Film Co., Ltd. (JP) 1990-10-31 EP claimed
US-4859563-A Positive photoresist composition MITSUBISHI CHEMICAL INDUSTRIES LIMITED (JP) 1989-08-22 US claimed
EP-0295626-A2 Photosensitive composition HITACHI, LTD. (JP) 1988-12-21 EP claimed
US-4719167-A Positive photoresist composition with 1,2 naphthoquinone diazide and novolak resin condensed from mixture of m-cresol, p-cresol, and 2,5-xylenol with formaldehyde MITSUBISHI CHEMICAL INDUSTRIES LTD. (JP) 1988-01-12 US claimed