SCHEMBL9973250

SCHEMBL9973250

O=[N+]([O-])CCN1CCNCC1

nearest known ligand 0.53

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
KCNJ1 P48048 4/20 0.53
KCNH2 Q12809 3/20 0.53
KDM4E B2RXH2 3/20 0.43
ALDH1A1 P00352 2/20 0.43
MAPT P10636 1/20 0.43
TDP1 Q9NUW8 1/20 0.43
MEN1 O00255 1/20 0.42
KMT2A Q03164 1/20 0.42
POLB P06746 1/20 0.42
SMN1; SMN2 Q16637 1/20 0.42
CXCR4 P61073 2/20 0.41
ADRB1 P08588 1/20 0.39
SIRT6 Q8N6T7 1/20 0.39
HSD17B10 Q99714 1/20 0.37
GAA P10253 1/20 0.35
TP53 P04637 1/20 0.35
SIGMAR1 Q99720 2/20 0.35
RAD52 P43351 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Ethoxycarbonyl Group SCHEMBL27613545 0.82 KCNJ1 (0.40) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL20214885 0.79 HRH3 (0.48) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL8670408 0.77 HRH3 (0.47) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL14818235 0.77 ALDH1A1 (0.42) KCNJ1KCNH2ALDH1A1MEN1KMT2A
SCHEMBL6091577 0.77 KCNJ1 (0.43) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL9317140 0.75 POLB (0.56) KCNJ1KCNH2ALDH1A1POLBSMN1; SMN2
SCHEMBL579720 0.74 POLB (0.50) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL20377303 0.74 KDM4E (0.47) KCNJ1KCNH2KDM4EALDH1A1MAPT
SCHEMBL237512 0.72 POLB (0.59) KCNJ1KCNH2ALDH1A1POLBSMN1; SMN2
SCHEMBL43582 0.70 CXCR4 (0.61) ALDH1A1MAPTTDP1MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9152049-B2 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition FUJIFILM CORPORATION (JP) 2015-10-06 US disclosed
US-9152049-B2 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition FUJIFILM CORPORATION (JP) 2015-10-06 US disclosed
WO-2013062066-A1 PATTERN FORMING METHOD, MULTI-LAYERED RESIST PATTERN, MULTI-LAYERED FILM FOR ORGANIC SOLVENT DEVELOPMENT, RESIST COMPOSITION, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2013-05-02 WO disclosed
WO-2013002417-A1 PATTERN FORMING METHOD, MULTI-LAYERED RESIST PATTERN, MULTI-LAYERED FILM FOR ORGANIC SOLVENT DEVELOPMENT, RESIST COMPOSITION, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2013-01-03 WO disclosed
US-20120156617-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-06-21 US disclosed
US-20120156617-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-06-21 US disclosed
WO-2011025065-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-03-03 WO disclosed