SCHEMBL9999741

SCHEMBL9999741

O=C(OCCCCC(F)(F)C(F)(F)S(=O)(=O)O)C12CC3CC(CC(C3)C1)C2

nearest known ligand 0.43

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 8/20 0.38
KMT2A Q03164 3/20 0.38
NPSR1 Q6W5P4 3/20 0.38
MEN1 O00255 2/20 0.38
MAPT P10636 2/20 0.38
PRKCA P17252 1/20 0.37
PKM P14618 1/20 0.36
CYP17A1 P05093 2/20 0.36
CYP19A1 P11511 2/20 0.36
ATM Q13315 1/20 0.36
GAA P10253 1/20 0.35
EPHX2 P34913 2/20 0.34
SMN1; SMN2 Q16637 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14241050 0.99 ALDH1A1 (0.37) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL19459382 0.99 ALDH1A1 (0.37) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL8894707 0.91 ALDH1A1 (0.40) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL14648929 0.90 EPHX2 (0.33) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL4273109 0.90 ALDH1A1 (0.40) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL14240907 0.89 ALDH1A1 (0.37) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL12556616 0.89 ALDH1A1 (0.39) ALDH1A1KMT2ANPSR1MEN1MAPT
SCHEMBL14648972 0.88 ALDH1A1 (0.44) ALDH1A1NPSR1GAASMN1; SMN2
SCHEMBL14648949 0.88 NPSR1 (0.43) ALDH1A1KMT2ANPSR1MEN1PKM
SCHEMBL14648938 0.88 NPSR1 (0.45) ALDH1A1KMT2ANPSR1MEN1MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 126 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11796912-B2 Radiation-sensitive composition and pattern-forming method JSR CORPORATION (JP) 2023-10-24 US disclosed
US-11796912-B2 Radiation-sensitive composition and pattern-forming method JSR CORPORATION (JP) 2023-10-24 US disclosed
US-20230314943-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND METHOD FOR MANUFACTURING RESIST FILM USING THE SAME MERCK PATENT GMBH (DE) 2023-10-05 US disclosed
US-11703757-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-18 US disclosed
US-11703757-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-18 US disclosed
US-20230213861-A1 METHOD FOR PRODUCING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-07-06 US disclosed
US-20230205082-A9 RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2023-06-29 US disclosed
US-20230205082-A9 RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2023-06-29 US disclosed
US-11687003-B2 Negative resist pattern-forming method, and composition for upper layer film formation JSR CORPORATION (JP) 2023-06-27 US disclosed
US-11687003-B2 Negative resist pattern-forming method, and composition for upper layer film formation JSR CORPORATION (JP) 2023-06-27 US disclosed
EP-2485090-A1 Radiation-sensitive resin composition for forming resist pattern JSR Corporation (JP) 2012-08-08 EP disclosed
WO-2012049919-A1 METHOD FOR FORMING RESIST PATTERN AND RADIATION-SENSITIVE RESIN COMPOSITION JSR株式会社 (JP) 2012-04-19 WO disclosed
WO-2011145703-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND JSR株式会社 (JP) 2011-11-24 WO disclosed
WO-2011145702-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND JSR株式会社 (JP) 2011-11-24 WO disclosed
US-20110143279-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2011-06-16 US disclosed
EP-2325694-A1 RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST PATTERN FORMATION METHOD JSR Corporation (JP) 2011-05-25 EP disclosed
US-20110112306-A1 Novel Sulfonic Acid Salt and Derivative thereof, Photo-Acid Generator, and Process for Production of Sulfonic Acid Salt CENTRAL GLASS COMPANY, LIMITED (JP) 2011-05-12 US disclosed
WO-2011037246-A1 RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN FORMATION METHOD, AND POLYMER JSR株式会社 (JP) 2011-03-31 WO disclosed
WO-2010029982-A1 RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST PATTERN FORMATION METHOD JSR株式会社 (JP) 2010-03-18 WO disclosed
WO-2010007910-A1 NOVEL SULFONIC ACID SALT AND DERIVATIVE THEREOF, PHOTO-ACID GENERATOR, AND PROCESS FOR PRODUCTION OF SULFONIC ACID SALT セントラル硝子株式会社 (JP) 2010-01-21 WO disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110112306-A1 Novel Sulfonic Acid Salt and Derivative thereof, Photo-Acid Generator, and Process for Production of Sulfonic Acid Salt ASIC1, FGFR1, PFAS ALDH1A1 1719/4885KMT2A 910/4885NPSR1 825/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.