SCHEMBL10175671

SCHEMBL10175671

C=CC(=O)OCCC(=O)OCCC(C)(F)F

nearest known ligand 0.43

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 7/20 0.43
HPGD P15428 1/20 0.43
ALDH1A1 P00352 4/20 0.43
TP53 P04637 3/20 0.43
HIF1A Q16665 3/20 0.43
CYP3A4 P08684 2/20 0.43
HSD17B10 Q99714 1/20 0.43
THRB P10828 2/20 0.41
MAPK1 P28482 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.36
ADRA2A P08913 1/20 0.32
ADRA1A P35348 1/20 0.32
MAPT P10636 1/20 0.31
BLM P54132 1/20 0.31
DGKA P23743 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10175676 0.87 TSHR (0.46) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL13759969 0.85 THRB (0.45) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL9143157 0.80 TSHR (0.64) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL2459290 0.80 TSHR (0.64) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL10175679 0.80 TSHR (0.50) TSHRHPGDALDH1A1TP53HIF1A
Propene SCHEMBL4273406 0.79 TSHR (0.57) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL9142692 0.79 ALDH1A1 (0.53) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL4265829 0.78 THRB (0.47) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL10226362 0.78 TSHR (0.47) TSHRHPGDALDH1A1TP53HIF1A
SCHEMBL20144563 0.78 TSHR (0.60) TSHRHPGDALDH1A1TP53HIF1A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8642244-B2 Resist composition for immersion exposure, method of forming resist pattern using the same, and fluorine-containing compound TOKYO OHKA KOGYO CO., LTD. (JP) 2014-02-04 US disclosed
US-8501387-B2 2013-08-06 US disclosed
US-20120077125-A1 RESIST COMPOSITION FOR IMMERSION EXPOSURE, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINING COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2012-03-29 US disclosed