SCHEMBL104808

SCHEMBL104808

C=Cc1ccccc1OC(=O)OC(C)(C)C

nearest known ligand 0.42

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
ELANE P08246 2/20 0.42
HPGD P15428 3/20 0.36
KDM4E B2RXH2 2/20 0.36
NFE2L2 Q16236 2/20 0.36
HSD17B10 Q99714 1/20 0.36
TFEB P19484 1/20 0.36
PTGDR2 Q9Y5Y4 1/20 0.35
ATM Q13315 1/20 0.35
TDP1 Q9NUW8 1/20 0.35
HTT P42858 3/20 0.34
SMN1; SMN2 Q16637 3/20 0.34
KMT2A Q03164 3/20 0.34
ALDH1A1 P00352 2/20 0.33
SRC P12931 1/20 0.33
BRD4 O60885 1/20 0.33
LMNA P02545 1/20 0.33
L3MBTL1 Q9Y468 1/20 0.33
NPC1 O15118 1/20 0.33
CA2 P00918 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6512118 0.93 MAPT (0.40) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL1913791 0.87 PTGDR2 (0.47) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL7711834 0.85 ELANE (0.39) ELANENFE2L2ATMKMT2ABRD4
SCHEMBL9777100 0.85 FBP1 (0.36) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL6393965 0.85 ALDH1A1 (0.39) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL9499670 0.84 HSD17B10 (0.42) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL2791736 0.84 PTGDR2 (0.42) HPGDKDM4ENFE2L2HSD17B10TFEB
SCHEMBL6564756 0.82 ELANE (0.39) ELANEHPGDKDM4ESMN1; SMN2KMT2A
SCHEMBL10709794 0.82 ELANE (0.36) ELANEHPGDKDM4ENFE2L2HSD17B10
SCHEMBL7542596 0.81 KDM4E (0.54) HPGDKDM4ENFE2L2HSD17B10TFEB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1040 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12535738-B2 Photoresist top coating material for etching rate control TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2026-01-27 US claimed
EP-1944775-B1 Production of electronic devices FLEXENABLE LTD (GB) 2017-10-25 EP claimed
US-7718235-B2 Overcoat composition for image recording materials EASTMAN KODAK COMPANY (US) 2010-05-18 US claimed
EP-2166543-A1 Production of electronic devices Plastic Logic Limited (GB) 2010-03-24 EP claimed
EP-1465877-B1 POSITIVE-WORKING PHOTOIMAGEABLE BOTTOM ANTIREFLECTIVE COATING AZ ELECTRONIC MATERIALS USA (US) 2008-09-24 EP claimed
EP-1944775-A1 Production of electronic devices Plastic Logic Limited (GB) 2008-07-16 EP claimed
US-20070141278-A1 OVERCOAT COMPOSITION FOR IMAGE RECORDING MATERIALS BANK OF AMERICA, N.A., AS AGENT 2007-06-21 US claimed
US-20070122744-A1 Positive-working photoresist composition and photosensitive material using same MAEMORI SATOSHI 2007-05-31 US claimed
US-7219989-B2 Overcoat composition for image recording materials EASTMAN KODAK COMPANY (US) 2007-05-22 US claimed
US-20070012950-A1 Production of electronic devices FLEXENABLE LIMITED (GB) 2007-01-18 US claimed
WO-1994011788-A1 METHOD OF PRODUCING MICROSTRUCTURES TECHNISCHE UNIVERSITEIT DELFT (NL) 1994-05-26 WO claimed
US-5250395-A Coating substrate with film of blocked polymer and aromatic dye, exposing to electromagnetic radiation, contacting with organometallic compound to form etch barrier, etching with reactive ions INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1993-10-05 US claimed
EP-0546703-A1 Lithographic material and processes involved in their use AT&T Corp. (US) 1993-06-16 EP claimed
EP-0540032-A1 Photoresist composition and etching method FUJI PHOTO FILM CO., LTD. (JP) 1993-05-05 EP claimed
EP-0102450-B1 RESIST COMPOSITIONS International Business Machines Corporation (US) 1991-09-04 EP claimed
EP-0282724-B1 NEGATIVE RESIST COMPOSITIONS International Business Machines Corporation (US) 1990-12-12 EP claimed
US-4908298-A Method of creating patterned multilayer films for use in production of semiconductor circuits and systems INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1990-03-13 US claimed
EP-0282724-A1 Negative resist compositions International Business Machines Corporation (US) 1988-09-21 EP claimed
US-4491628-A TERT-BUTYL ESTERS OR CARBONATES INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1985-01-01 US claimed
EP-0102450-A2 Resist compositions International Business Machines Corporation (US) 1984-03-14 EP claimed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12535738-B2 Photoresist top coating material for etching rate control ALKBH2, TOP2A, KDM2A ELANE 2342/4885HPGD 4001/4885KDM4E 16/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.