SCHEMBL107643

SCHEMBL107643

CCCCOCC(C)OC(C)=O

nearest known ligand 0.57

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.47
PLA2G2C Q5R387 2/20 0.42
TSHR P16473 2/20 0.42
CHRM2 P08172 1/20 0.42
CHRM4 P08173 1/20 0.42
CHRM1 P11229 1/20 0.42
TBXA2R P21731 1/20 0.42
CES2 O00748 1/20 0.41
GALR3 O60755 1/20 0.41
MAPT P10636 1/20 0.41
BLM P54132 1/20 0.41
SMN1; SMN2 Q16637 1/20 0.41
ADRA1D P25100 1/20 0.41
PTAFR P25105 1/20 0.41
HTR1D P28221 1/20 0.41
HTR2C P28335 1/20 0.41
ADRA1B P35368 1/20 0.41
DRD3 P35462 1/20 0.41
TMEM97 Q5BJF2 1/20 0.41
TDP1 Q9NUW8 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Water SCHEMBL27447449 0.98 ALDH1A1 (0.45) ALDH1A1PLA2G2CTSHRCHRM2CHRM4
SCHEMBL15259597 0.96 TDP1 (0.46) ALDH1A1PLA2G2CTSHRCHRM2CHRM4
Ethylene Glycol SCHEMBL29015827 0.95 TSHR (0.44) ALDH1A1PLA2G2CTSHRCHRM2CHRM4
SCHEMBL2230535 0.94 PLA2G2C (0.49) PLA2G2CCES2ADRA1DPTAFRHTR1D
SCHEMBL487272 0.93 TDP1 (0.47) ALDH1A1PLA2G2CTSHRCHRM2CHRM4
SCHEMBL895988 0.93 TDP1 (0.47) ALDH1A1PLA2G2CTSHRCHRM2CHRM4
SCHEMBL896030 0.93 CES2 (0.52) PLA2G2CCES2ADRA1DPTAFRHTR1D
SCHEMBL466059 0.93 CES2 (0.52) PLA2G2CCES2ADRA1DPTAFRHTR1D
SCHEMBL6881438 0.93 CES2 (0.52) PLA2G2CCES2ADRA1DPTAFRHTR1D
SCHEMBL28120656 0.89 ALDH1A1 (0.44) ALDH1A1PLA2G2CTSHRCHRM2CHRM4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 6451 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260147279-A1 DEVELOPER COMPOSITION FOR METAL-CONTAINING PHOTORESIST, AND METHOD OF FORMING PATTERNS INCLUDING DEVELOPING METHOD USING THE COMPOSITION SAMSUNG SDI CO., LTD. (KR) 2026-05-28 US claimed
US-20260016747-A1 RESIST COMPOSITION AND METHOD OF FORMING PATTERN BY USING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2026-01-15 US claimed
US-20250377591-A1 PHOTORESIST COMPOSITION AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE SAMSUNG ELECTRONICS CO LTD (KR) 2025-12-11 US claimed
US-12393122-B2 Thinner composition and method of processing surfaces of semiconductor substrates SK Hynix Inc. (KR) 2025-08-19 US claimed
CN-119993603-A Acetic acid-resistant conductive paste, front electrode and solar cell 成都汉普高新材料有限公司 2025-05-13 CN claimed
CN-119552063-B Method for separating methanol-methylal mixture 湖南工程学院 2025-05-13 CN claimed
WO-2025073152-A1 PREPARATION AND DIFFUSION TREATMENT METHOD FOR HIGH-PERFORMANCE DIFFUSION COATING USED FOR SINTERED NEODYMIUM-IRON-BORON MAGNET 浙江鑫盛永磁科技股份有限公司 2025-04-10 WO claimed
CN-119751742-A Photosensitive polyacrylate and preparation method thereof, UV (ultraviolet) glue reducing adhesive tape 深圳先进电子材料国际创新研究院 2025-04-04 CN claimed
CN-118995105-B Conductive silver adhesive for Micro-Led adhesion and preparation method and application method thereof 先禾新材料(苏州)有限公司 2025-03-28 CN claimed
CN-118109119-B Long-acting anti-fouling artistic coating and preparation method thereof 重庆凯茜蔓科技有限公司 2025-03-28 CN claimed
CN-1412251-A Nano zinc oxide slurry composition and its preparation method INST METALS CHINESE ACAD SCI (CN) 2003-04-23 CN claimed
CN-1412258-A Nano UV resistant acrylate paint INST METALS CHINESE ACAD SCI (CN) 2003-04-23 CN claimed
CN-1410490-A Nano titanium dioxide paste composition and its preparation method INST METALS CHINESE ACAD SCI (CN) 2003-04-16 CN claimed
CN-1389500-A Separation process of free monomer for polyurethane curing agent UNIV SOUTH CHINA SCIENCE & ENG (CN) 2003-01-08 CN claimed
US-6379860-B1 RESIN OBTAINED BY REACTION OF ALKALI-SOLUBLE RESIN HAVING PHENOLIC HYDROXYL GROUPS WITH ENOL ETHER DECOMPOSES IN ACID TO INCREASE SOLUBILITY; HEAT RESISTANCE, SENSITIVIY, RESOLUTION; GENERATES ACID UPON ACTINIC RADIATION EXPOSURE FUJI PHOTO FILM CO., LTD. (JP) 2002-04-30 US claimed
EP-0846149-B1 COLOURANT COMPOSITION FOR PAINT PRODUCTS TIKKURILA CPS OY (FI) 1999-11-03 EP claimed
EP-0616016-B1 Stripping agent SCHEIDEL GMBH & CO KG (DE) 1999-06-30 EP claimed
US-5916729-A A POSITIVE TONE TYPE REISTS CONSISTS OF A RESIN WHICH HAS AN ACIDIC FUNCTIONAL GROUP PROTECTED BY AN ACID DECOMPOSABLE GROUP AND IS HYDROLYZABLE, A PHOTOACID GENERATOR AND A SOLVENT MIXTURE OF ALKYL LACTATE WITH PROPYLENE GLYCOL ETHER JSR CORPORATION (JP) 1999-06-29 US claimed
EP-0846149-A1 COLOURANT COMPOSITION FOR PAINT PRODUCTS Tikkurila CPS Oy (FI) 1998-06-10 EP claimed
WO-1997008255-A1 COLOURANT COMPOSITION FOR PAINT PRODUCTS TIKKURILA CPS OY (FI) 1997-03-06 WO claimed