SCHEMBL1104199

SCHEMBL1104199

CCC(C)(C)C(=O)OCCNC(=O)Nc1ccc(O)cc1

nearest known ligand 0.46

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
MAPT P10636 3/20 0.46
THRB P10828 3/20 0.46
GAA P10253 3/20 0.46
L3MBTL1 Q9Y468 3/20 0.46
RECQL P46063 2/20 0.46
MEN1 O00255 1/20 0.44
KMT2A Q03164 1/20 0.44
KDM4E B2RXH2 1/20 0.43
TP53 P04637 1/20 0.43
PLEC Q15149 1/20 0.43
ADRB2 P07550 1/20 0.42
ADRB1 P08588 1/20 0.42
ADRB3 P13945 1/20 0.42
MTOR P42345 1/20 0.41
NPSR1 Q6W5P4 1/20 0.41
SMN1; SMN2 Q16637 1/20 0.40
EPHX2 P34913 2/20 0.40
CNR1 P21554 2/20 0.40
ALDH1A1 P00352 1/20 0.40
MAOA P21397 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL801356 0.88 SMN1; SMN2 (0.53) MAPTGAAL3MBTL1KDM4ENPSR1
SCHEMBL801355 0.87 EPHX2 (0.48) MAPTGAAMEN1KMT2ANPSR1
SCHEMBL13223590 0.86 EPHX1 (0.47) GAAL3MBTL1MEN1KMT2ANPSR1
SCHEMBL12338026 0.85 MAPT (0.43) MAPTTHRBGAAL3MBTL1RECQL
SCHEMBL2742140 0.85 EPHX2 (0.49) MAPTGAANPSR1EPHX2ALDH1A1
SCHEMBL13667501 0.84 CA2 (0.60) L3MBTL1MEN1KMT2AKDM4E
SCHEMBL12126301 0.81 EPHX2 (0.45) MAPTMEN1KMT2ASMN1; SMN2EPHX2
SCHEMBL13667487 0.81 ALDH1A1 (0.57) MAPTGAAKMT2AKDM4ENPSR1
SCHEMBL12755474 0.81 HDAC1 (0.38) MAPTGAAMEN1KMT2ATP53
SCHEMBL13256667 0.80 KDM4E (0.50) L3MBTL1MEN1KMT2AKDM4ESMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160209747-A1 ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, RESIST-COATED MASK BLANK, METHOD FOR PRODUCING PHOTOMASK, PHOTOMASK, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE, EACH OF WHICH USES SAID ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2016-07-21 US disclosed
US-9034560-B2 Negative resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2015-05-19 US disclosed
US-20140227642-A1 NEGATIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2014-08-14 US disclosed
US-8637220-B2 Actinic ray-sensitive or radiation-sensitive resin composition, and resist film and pattern forming method using the composition FUJIFILM CORPORATION (JP) 2014-01-28 US disclosed
US-8637222-B2 Negative resist pattern forming method, developer and negative chemical-amplification resist composition used therefor, and resist pattern FUJIFILM CORPORATION (JP) 2014-01-28 US disclosed
US-20130004897-A1 METHOD FOR MANUFACTURING A PLANOGRAPHIC PRINTING PLATE FUJIFILM CORPORATION (JP) 2013-01-03 US disclosed
US-8283107-B2 Imageable elements and methods useful for providing waterless printing plates EASTMAN KODAK COMPANY (US) 2012-10-09 US disclosed
US-8263307-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2012-09-11 US disclosed
US-8151705-B2 Method of preparing lithographic printing plate FUJIFILM CORPORATION (JP) 2012-04-10 US disclosed
US-20120003583-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-01-05 US disclosed
US-20100081771-A1 METHOD OF PREPARING LITHOGRAPHIC PRINTING PLATE FUJIFILM CORPORATION (JP) 2010-04-01 US disclosed
US-20090305162-A1 IMAGEABLE ELEMENTS AND METHODS USEFUL FOR PROVIDING WATERLESS PRINTING PLATES FAR EAST DEVELOPMENT LTD. 2009-12-10 US disclosed
US-20090269701-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-29 US disclosed
US-20090246693-A1 NEGATIVE-WORKING LITHOGRAPHIC PRINTING PLATE PRECURSOR AND METHOD OF LITHOGRAPHIC PRINTING USING SAME FUJIFILM CORPORATION (JP) 2009-10-01 US disclosed
US-7521168-B2 Compound that has a reduction potential higher than that of diphenyl iodonium salt and generates an acid upon irradiation of an actinic ray or radiation. FUJIFILM CORPORATION (JP) 2009-04-21 US disclosed
US-7507525-B2 Polymerizable composition and lithographic printing plate precursor FUJIFILM CORPORATION (JP) 2009-03-24 US disclosed
US-7432034-B2 Negative resist composition FUJIFILM CORPORATION (JP) 2008-10-07 US disclosed
US-20080241745-A1 Mixture of alkali soluble polymer, crosslinking agent, acid generator ; radiation with actinic radiation; quaternary ammonium compound FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
US-7279539-B2 Alkali-soluble polymer and polymerizable composition thereof FUJIFILM CORPORATION (JP) 2007-10-09 US disclosed
US-7163777-B2 Thermally imagable article comprising substrate coated with positive working heat-sensitive, hydroxyl group-containing polymer and a heat-labile moiety which decreases developer solubility; free of acid generators EASTMAN KODAK COMPANY (US) 2007-01-16 US disclosed