SCHEMBL1151137

SCHEMBL1151137

CC1(C23C=CC(CC2C(=O)O)C3)CCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1349275 0.98 HSD11B1 (0.30)
SCHEMBL2477129 0.77 HSD11B1 (0.33)
SCHEMBL6758974 0.76 HSD11B1 (0.32)
SCHEMBL7201984 0.74 HSD11B1 (0.31)
SCHEMBL1518812 0.73 APLNR (0.34)
SCHEMBL2476473 0.71 HSD11B1 (0.36)
SCHEMBL6864996 0.67
SCHEMBL3686492 0.67 SLC1A2 (0.35)
SCHEMBL3173540 0.66 SLC6A4 (0.32)
SCHEMBL7644965 0.66 SLC6A4 (0.39)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8334088-B2 Functionalized carbosilane polymers and photoresist compositions containing the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-12-18 US disclosed
US-8247162-B2 Methods of forming a pattern using photoresist compositions SAMSUNG ELECTRONICS CO., LTD. (KR) 2012-08-21 US disclosed
US-20110045407-A1 Functionalized Carbosilane Polymers and Photoresist Compositions Containing the Same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-02-24 US disclosed
US-7883828-B2 generating a resist image with polycarbosilanes as acid generator, having acid labile functionality; high refractive index (n&gt;1.7) and absorbance at 193 nm that is relatively low (A&lt;3.00 mu m-1); aqueous base soluble; suitable for use immersion lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-02-08 US disclosed
US-7824845-B2 Functionalized carbosilane polymers and photoresist compositions containing the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-11-02 US disclosed
US-20100266966-A1 Methods of forming a pattern using photoresist compositions SAMSUNG ELECTRONICS CO., LTD. (KR) 2010-10-21 US disclosed
US-20090081598-A1 FUNCTIONALIZED CARBOSILANE POLYMERS AND PHOTORESIST COMPOSITIONS CONTAINING THE SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 US disclosed
US-20090081597-A1 generating a resist image with polycarbosilanes as acid generator, having acid labile functionality; high refractive index (n&gt;1.7) and absorbance at 193 nm that is relatively low (A&lt;3.00 mu m-1); aqueous base soluble; suitable for use immersion lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 US disclosed
US-20090081579-A1 FUNCTIONALIZED CARBOSILANE POLYMERS AND PHOTORESIST COMPOSITIONS CONTAINING THE SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 US disclosed
US-20090081585-A1 FUNCTIONALIZED CARBOSILANE POLYMERS AND PHOTORESIST COMPOSITIONS CONTAINING THE SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 US disclosed
US-7341818-B2 Norbornene-type monomers and polymers containing pendent lactone or sultone groups PROMERUS LLC (US) 2008-03-11 US disclosed
EP-1709486-A2 NORBORNENE-TYPE MONOMERS AND POLYMERS CONTAINING PENDENT LACTONE OR SULTONE GROUPS Promerus, LLC (US) 2006-10-11 EP disclosed
US-7101654-B2 Norbornene-type monomers and polymers containing pendent lactone or sultone groups PROMERUS LLC (US) 2006-09-05 US disclosed
WO-2005070993-A2 NORBORNENE-TYPE MONOMERS AND POLYMERS CONTAINING PENDENT LACTONE OR SULTONE GROUPS PROMERUS LLC (US) 2005-08-04 WO disclosed
US-20050153240-A1 Norbornene-type monomers and polymers containing pendent lactone or sultone groups SUMITOMO BAKELITE CO., LTD. (JP) 2005-07-14 US disclosed
US-20050153233-A1 Norbornene-type monomers and polymers containing pendent lactone or sultone groups SUMITOMO BAKELITE CO., LTD. (JP) 2005-07-14 US disclosed