SCHEMBL12015342

SCHEMBL12015342

CC(C)(C)C(=O)N1C(=O)CCC1F

nearest known ligand 0.33

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ACE P12821 2/20 0.33
CNR2 P34972 1/20 0.33
RIPK1 Q13546 3/20 0.33
MEN1 O00255 1/20 0.32
KMT2A Q03164 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12015346 0.89 RIPK1 (0.33) CNR2RIPK1MEN1KMT2A
SCHEMBL12015339 0.88 RIPK1 (0.33) CNR2RIPK1
SCHEMBL12015349 0.81 RIPK1 (0.37) RIPK1MEN1KMT2A
SCHEMBL12015343 0.79 ACE (0.34) ACERIPK1MEN1KMT2A
SCHEMBL21945623 0.76 ACE (0.53) ACERIPK1MEN1KMT2A
SCHEMBL12015348 0.75 ACE (0.32) ACERIPK1MEN1KMT2A
SCHEMBL12015347 0.73 PER2 (0.34) RIPK1MEN1KMT2A
SCHEMBL12015357 0.73 CHRM2 (0.36) ACERIPK1MEN1KMT2A
SCHEMBL12015368 0.71 CA1 (0.34) RIPK1KMT2A
SCHEMBL12764284 0.70 GSK3B (0.32) ACE

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-20160077433-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8859182-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-10-14 US disclosed
US-8563217-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-10-22 US disclosed
US-20130022910-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-01-24 US disclosed
US-20120219907-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed
US-20120219898-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-08-30 US disclosed