SCHEMBL12430202

SCHEMBL12430202

CCC(C)C(=O)OC(C)(C)C12CC3CC(CC(O)(C3)C1)C2

nearest known ligand 0.40

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
DPP4 P27487 3/20 0.36
HSD11B1 P28845 3/20 0.35
L3MBTL1 Q9Y468 1/20 0.35
ALDH1A1 P00352 3/20 0.34
NPSR1 Q6W5P4 1/20 0.32
MDH1 P40925 1/20 0.32
MDH2 P40926 1/20 0.32
ABL1 P00519 1/20 0.31
TSHR P16473 1/20 0.31
RIN1 Q13671 1/20 0.31
PKM P14618 1/20 0.31
THRB P10828 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13995725 0.88 DPP4 (0.31) DPP4
SCHEMBL14557132 0.87 HSD11B1 (0.34) DPP4HSD11B1L3MBTL1ALDH1A1NPSR1
SCHEMBL12134118 0.87 ALDH1A1 (0.32) ALDH1A1
SCHEMBL111708 0.86 ALDH1A1 (0.38) L3MBTL1ALDH1A1
SCHEMBL2734498 0.85 ALDH1A1 (0.39) L3MBTL1ALDH1A1NPSR1TSHRPKM
SCHEMBL14010932 0.84 ALDH1A1 (0.34) DPP4HSD11B1L3MBTL1ALDH1A1NPSR1
SCHEMBL13115388 0.79 PKM (0.37) DPP4HSD11B1ALDH1A1NPSR1MDH1
SCHEMBL9945803 0.78 HSD11B1 (0.36) DPP4HSD11B1ALDH1A1NPSR1MDH1
SCHEMBL15268357 0.78 HSD11B1 (0.36) DPP4HSD11B1ALDH1A1MDH1MDH2
SCHEMBL9924478 0.77 ALDH1A1 (0.42) DPP4HSD11B1L3MBTL1ALDH1A1NPSR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9696629-B2 Photoresist pattern trimming compositions and methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-07-04 US disclosed
US-20160187783-A1 PHOTORESIST PATTERN TRIMMING COMPOSITIONS AND METHODS U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2016-06-30 US disclosed
US-7977029-B2 Positive photosensitive composition FUJIFILM CORPORATION (JP) 2011-07-12 US disclosed
US-7514201-B2 Positive photosensitive composition FUJIFILM CORPORATION (JP) 2009-04-07 US disclosed
US-20080318159-A1 POSITIVE PHOTOSENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2008-12-25 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-7255971-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-08-14 US disclosed
US-7255971-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-08-14 US disclosed
US-7235341-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-26 US disclosed
US-7235341-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-26 US disclosed
US-20070141513-A1 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. 2007-06-21 US disclosed
US-7163781-B2 Process for producing a semiconductor device KABUSHIKI KAISHA TOSHIBA (JP) 2007-01-16 US disclosed