SCHEMBL132348

SCHEMBL132348

C[S+](C)c1ccc(O)c2ccccc12

nearest known ligand 0.59

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 10/20 0.59
EP300 Q09472 3/20 0.46
KAT2B Q92831 3/20 0.46
KAT8 Q9H7Z6 3/20 0.46
HDAC3 O15379 1/20 0.46
NCOR2 Q9Y618 1/20 0.46
LDHA P00338 1/20 0.45
CTSB P07858 1/20 0.39
CYP1A2 P05177 1/20 0.39
APP P05067 1/20 0.39
MAPT P10636 1/20 0.39
THRB P10828 1/20 0.39
HPGD P15428 1/20 0.39
ALOX15 P16050 1/20 0.39
TSHR P16473 1/20 0.39
CASP1 P29466 1/20 0.39
SNCA P37840 1/20 0.39
RECQL P46063 1/20 0.39
HSD17B10 Q99714 1/20 0.39
TDP1 Q9NUW8 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29420748 1.00 IDO1 (0.59) IDO1EP300KAT2BKAT8HDAC3
Hydrochloric Acid SCHEMBL4410534 0.98 IDO1 (0.56) IDO1EP300KAT2BKAT8HDAC3
SCHEMBL1130216 0.92 IDO1 (0.50) IDO1EP300KAT2BKAT8HDAC3
SCHEMBL12748736 0.86 IDO1 (0.59) IDO1EP300KAT2BKAT8HDAC3
SCHEMBL1130786 0.86 IDO1 (0.43) IDO1EP300KAT2BKAT8HDAC3
SCHEMBL1130788 0.83 IDO1 (0.41) IDO1EP300KAT2BKAT8HDAC3
Trifluoroacetic Acid SCHEMBL1130145 0.83 IDO1 (0.41) IDO1EP300KAT2BKAT8HDAC3
Trifluoromethanesulfonic Acid SCHEMBL36124 0.82 LDHA (0.44) IDO1EP300KAT2BKAT8LDHA
Trifluoromethanesulfonic Acid SCHEMBL31168271 0.82 LDHA (0.44) IDO1EP300KAT2BKAT8LDHA
SCHEMBL1130239 0.79 EP300 (0.51) IDO1EP300KAT2BKAT8LDHA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 582 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7682770-B2 Resist composition and method for forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2010-03-23 US claimed
US-20250213434-A1 DENTAL CURABLE COMPOSITION HAVING FAVORABLE COLOR COMPATIBILITY KURARAY NORITAKE DENTAL INC. (JP) 2025-07-03 US disclosed
EP-4505992-A1 DENTAL CURABLE COMPOSITION HAVING FAVORABLE COLOR COMPATIBILITY Kuraray Noritake Dental Inc. (JP) 2025-02-12 EP disclosed
CN-119317999-A Method for processing component 日东电工株式会社 2025-01-14 CN disclosed
CN-119301209-A Transfer sheet 日东电工株式会社 2025-01-10 CN disclosed
CN-118946340-A Curable composition for dentistry having excellent color tone adaptability 可乐丽则武齿科株式会社 2024-11-12 CN disclosed
EP-4091578-B1 METHOD FOR PRODUCING PLATE DENTURE TOKUYAMA DENTAL CORP (JP) 2024-10-09 EP disclosed
WO-2024075641-A1 POLYMER MATERIAL FOR USE IN DENTISTRY サンメディカル株式会社 2024-04-11 WO disclosed
US-11857385-B2 Method of producing plate denture, curable composition for stereolithography, and plate denture production kit TOKUYAMA DENTAL CORPORATION (JP) 2024-01-02 US disclosed
WO-2023243636-A1 MEMBER PROCESSING METHOD 日東電工株式会社 2023-12-21 WO disclosed
EP-1422254-A2 Photocationic polymerization initiator and photocationically polymerizable composition Tokuyama Corporation (JP) 2004-05-26 EP disclosed
EP-1398339-A1 POLYSILOXANE, PROCESS FOR PRODUCTION THEREOF AND RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2004-03-17 EP disclosed
US-20040048192-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2004-03-11 US disclosed
US-20040009427-A1 Negative resist composition TOKYO OHKA KOGYO CO., LTD. 2004-01-15 US disclosed
US-20030219680-A1 Photoresists useful for microfabrication utilizing deep ultraviolet rays such as an excimer laser, x-rays such as synchrotron radiation, and electron beams JSR CORPORATION (JP) 2003-11-27 US disclosed
US-20030170561-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2003-09-11 US disclosed
US-20030008233-A1 Negative-working photoresist composition HADA HIDEO (JP) 2003-01-09 US disclosed
US-6444397-B2 AMPLIFICATION; PHOTOLITHOGRAPHY PATTERNING TOKYO OHKA KOGYO CO., LTD. (JP) 2002-09-03 US disclosed
US-20010049073-A1 Negative-working photoresist composition HADA HIDEO (JP) 2001-12-06 US disclosed
EP-1128212-A2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2001-08-29 EP disclosed