SCHEMBL1346321

SCHEMBL1346321

Cc1ccc(C(=O)C(=NOC(=O)c2ccccc2)C(=O)c2ccc(C)cc2)cc1

nearest known ligand 0.62

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 4/20 0.62
ALDH1A1 P00352 3/20 0.62
CES2 O00748 1/20 0.61
CES1 P23141 1/20 0.61
L3MBTL1 Q9Y468 1/20 0.57
NPC1 O15118 6/20 0.54
RAB9A P51151 6/20 0.54
PKM P14618 4/20 0.54
CDK5 Q00535 3/20 0.54
CDK5R1 Q15078 3/20 0.54
PAX8 Q06710 1/20 0.54
SMN1; SMN2 Q16637 3/20 0.53
CYP1A2 P05177 1/20 0.53
POLB P06746 1/20 0.53
MAPT P10636 3/20 0.51
MEN1 O00255 1/20 0.50
TNF P01375 1/20 0.50
KLF5 Q13887 1/20 0.50
NOD1 Q9Y239 1/20 0.50

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1348555 0.89 NPC1 (0.54) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL10903675 0.83 CYP1A2 (0.74) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL19795459 0.80 KMT2A (0.52) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL19795426 0.80 KMT2A (0.65) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL153153 0.80 ALDH1A1 (0.56) KMT2AALDH1A1L3MBTL1NPC1RAB9A
SCHEMBL10779108 0.79 MAPT (0.54) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL2157002 0.78 CES2 (1.00) KMT2AALDH1A1CES2CES1NPC1
SCHEMBL27806794 0.78 AKR1C3 (0.49) L3MBTL1NPC1RAB9APKMCDK5
SCHEMBL195165 0.77 KMT2A (0.62) KMT2AALDH1A1CES2CES1L3MBTL1
SCHEMBL20278523 0.77 KMT2A (0.62) KMT2AALDH1A1CES2CES1L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20150024326-A1 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES KAYAKU ADVANCED MATERIALS, INC. 2015-01-22 US disclosed
US-20150024326-A1 PHOTOIMAGEABLE COMPOSITIONS AND PROCESSES FOR FABRICATION OF RELIEF PATTERNS ON LOW SURFACE ENERGY SUBSTRATES KAYAKU ADVANCED MATERIALS, INC. 2015-01-22 US disclosed
US-8063245-B2 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2011-11-22 US disclosed
US-20100218984-A1 PHOTOSENSITIVE DRY FILM RESIST, PRINTED WIRING BOARD MAKING USE OF THE SAME, AND PROCESS FOR PRODUCING PRINTED WIRING BOARD KANEKA CORPORATION (JP) 2010-09-02 US disclosed
US-7396898-B2 Diamine, acid dianhydride, and reactive group containing polyimide composition prepared therefrom and process of preparing them KANEKA CORPORATION (JP) 2008-07-08 US disclosed
US-20060199920-A1 Photosensitive resin composition capable of being developed with aqueous developer and photosensitive dry film resist, and use thereof KANEKA CORPORATION (JP) 2006-09-07 US disclosed
US-20060142542-A1 Phosphazene compound, photosensitive resin composition and use thereof KANEKA CORPORATION (JP) 2006-06-29 US disclosed
US-20040235992-A1 Photosensitive resin composition and photosensitive dry film resist and photosensitive coverlay film produced therefrom KANEKA CORPORATION (JP) 2004-11-25 US disclosed
EP-0814109-B1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL CO LTD (JP) 2004-08-18 EP disclosed
US-20040158030-A1 Diamine, acid dianhydride, polymide composition having reactive group obtained therefrom, and processes for producing these KANEKA CORPORATION (JP) 2004-08-12 US disclosed
US-20040048978-A1 Photosensitive resin composition, solder resist comprising the same, cover lay film, and printed circuit board KANEKA CORPORATION (JP) 2004-03-11 US disclosed
US-6605353-B2 Polyimide derived from a dianhydride and diamine having hydroxyl or carboxyl groups, which are modified with a diepoxide or unsaturated group-containing epoxide; curable; heat resistance, dielectric, film-forming KANEKA CORPORATION (JP) 2003-08-12 US disclosed
US-20020048726-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-04-25 US disclosed
US-20010056174-A1 Epoxy-modified polyimide, photosensitive composition, coverlay film, solder resist, and printed wiring board using the epoxy-modified polyimide KANEKA CORPORATION (JP) 2001-12-27 US disclosed
US-6319656-B1 FORMING FILM OF A NEGATIVE-WORKING PHOTO-SENSITIVE POLYIMIDE PRECURSOR ON A SUBSTRATE; EXPOSING FILM TO LIGHT THROUGH A MASK HAVING A PREDETERMINED PATTERN; DEVELOPING THE EXPOSED FILM USING AN ALKALINE AQUEOUS SOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2001-11-20 US disclosed
US-6200831-B1 HEAT-CURING A COATING OF A POLYAMIC ACID BASED ON A TETRACARBOXYLIC ACID AND A DIAMINE CONTAINNG AN ACTIVE OXYGEN OR NITROGEN FUNCTIONAL GROUP; SEALING THE EXTERNAL TERMINALS WITH A RESIN, E.G. AN EPOXIDE HITACHI, LTD. (JP) 2001-03-13 US disclosed
US-6087006-A SEMICONDUCTOR DEVICE HAVING SURFACE-PROTECTING FILM COMPRISING POLYIMIDE OBTAINED BY HEAT-CURING PRECURSOR HAVING POLAR SUBSTITUENTS AS THE SIDE CHAINS HITACHI, LTD. (JP) 2000-07-11 US disclosed
US-6025113-A FOR PREPARING HIGHLY SENSITIVE NEGATIVE-WORKING PHOTOSENSITIVE MATERIAL DEVELOPABLE WITH ALKALINE AQUEOUS SOLUTION IN SHORT TIME WITH HIGH RESOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2000-02-15 US disclosed
EP-0814109-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 1997-12-29 EP disclosed