SCHEMBL134897

SCHEMBL134897

CCCCC(C)C1CCCC1

nearest known ligand 0.41

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
SHBG P04278 1/20 0.41
CYP1A2 P05177 1/20 0.39
METAP1 P53582 1/20 0.34
SIGMAR1 Q99720 1/20 0.34
DNM1 Q05193 1/20 0.33
MEN1 O00255 1/20 0.33
KMT2A Q03164 1/20 0.33
MMP1 P03956 1/20 0.33
MMP7 P09237 1/20 0.33
MMP12 P39900 1/20 0.33
ECE1 P42892 1/20 0.33
MMP13 P45452 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL134684 0.98 SHBG (0.44) SHBGCYP1A2SIGMAR1MMP1MMP7
SCHEMBL28327494 0.95 SHBG (0.36) SHBGCYP1A2METAP1DNM1
SCHEMBL9213838 0.93 OPRM1 (0.41) SHBGCYP1A2
SCHEMBL27676667 0.91 OPRM1 (0.39) SHBGCYP1A2SIGMAR1
SCHEMBL9204420 0.91 SHBG (0.43) SHBGCYP1A2SIGMAR1
SCHEMBL9202942 0.91 OPRM1 (0.39) SHBGCYP1A2SIGMAR1
SCHEMBL327325 0.91 OPRM1 (0.39) SHBGCYP1A2SIGMAR1
SCHEMBL9206536 0.91 OPRM1 (0.39) SHBGCYP1A2SIGMAR1
SCHEMBL11844847 0.90
SCHEMBL11085237 0.89 SHBG (0.41) SHBGCYP1A2SIGMAR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 185 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2584409-B1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, POLYMERIC COMPOUND, AND COMPOUND TOKYO OHKA KOGYO CO LTD (JP) 2021-04-28 EP disclosed
EP-2060600-B1 Resist composition, method of forming resist pattern, novel compound, and acid generator TOKYO OHKA KOGYO CO LTD (JP) 2017-12-27 EP disclosed
US-9834696-B2 Undercoat agent and method of forming pattern of layer containing block copolymer TOKYO OHKA KOGYO CO., LTD. (JP) 2017-12-05 US disclosed
US-9821338-B2 Method of producing structure containing phase-separated structure utilizing a brush composition comprising PS-PMMA TOKYO OHKA KOGYO., LTD. (JP) 2017-11-21 US disclosed
US-9776208-B2 Brush composition, and method of producing structure containing phase-separated structure TOKYO OHKA KOGYO CO., LTD. (JP) 2017-10-03 US disclosed
US-9618843-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2017-04-11 US disclosed
US-9494866-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2016-11-15 US disclosed
US-9494860-B2 Resist composition, method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2016-11-15 US disclosed
EP-2088466-B1 Resist composition for immersion exposure, method of forming resist pattern using the same, and fluorine-containing compound TOKYO OHKA KOGYO CO LTD (JP) 2016-10-26 EP disclosed
US-9459535-B2 Method of forming pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2016-10-04 US disclosed
CN-101408728-A Resist composition, method of forming resist pattern, novel compound and method of producing the same TOKYO OHKA KOGYO CO LTD (JP) 2009-04-15 CN disclosed
US-20090068591-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND AND METHOD OF PRODUCING THE SAME, AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2009-03-12 US disclosed
US-7488568-B2 Resist composition, method of forming resist pattern, compound and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-10 US disclosed
US-20080311515-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2008-12-18 US disclosed
US-20080311522-A1 Comprising base component which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component which generates acid upon irradiation TOKYO OHKA KOGYO CO., LTD. (JP) 2008-12-18 US disclosed
US-20080248422-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2008-10-09 US disclosed
EP-1599465-A1 SUBSTITUTED N-ARYL NITROGEN HETEROCYCLES Bayer CropScience AG (DE) 2005-11-30 EP disclosed
WO-2004074274-A1 SUBSTITUTED N-ARYL NITROGEN HETEROCYCLES BAYER CROPSCIENCE AKTIENGESELLSCHAFT (DE) 2004-09-02 WO disclosed
EP-0421441-B1 Pantothenic acid derivatives FUJIREBIO KK (JP) 1995-01-25 EP disclosed
US-5120738-A Cardiovascular disorders FUJIREBIO INC. (JP) 1992-06-09 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20080311522-A1 Comprising base component which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component which generates acid upon irradiation GNG2, ACAD9, SCO2 SHBG 2859/4885CYP1A2 680/4885METAP1 2722/4885
US-20090068591-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND AND METHOD OF PRODUCING THE SAME, AND ACID GENERATOR RER1, C1R, ABCC1 SHBG 3426/4885CYP1A2 93/4885METAP1 3893/4885
US-20080248422-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR RER1, ACAD9, RRS1 SHBG 2795/4885CYP1A2 798/4885METAP1 3006/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.