SCHEMBL13601066

SCHEMBL13601066

Nc1ccc(C(=O)Nc2cc(S(=O)(=O)c3ccc(O)c(NC(=O)c4ccc(N)cc4)c3)ccc2O)cc1

nearest known ligand 0.60

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HDAC1 Q13547 3/20 0.60
MAPT P10636 2/20 0.60
RAB9A P51151 1/20 0.60
CA1 P00915 4/20 0.56
CA2 P00918 4/20 0.56
CA12 O43570 3/20 0.56
CA9 Q16790 3/20 0.56
PRMT1 Q99873 3/20 0.55
SETD7 Q8WTS6 1/20 0.52
NPC1 O15118 1/20 0.49
CASP6 P55212 1/20 0.48
CTDSP1 Q9GZU7 1/20 0.48
MEN1 O00255 1/20 0.47
LMNA P02545 1/20 0.47
POLB P06746 1/20 0.47
PKM P14618 1/20 0.47
APEX1 P27695 1/20 0.47
KMT2A Q03164 1/20 0.47
TDP1 Q9NUW8 1/20 0.47
GAA P10253 1/20 0.47

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18360221 0.91 HDAC1 (0.57) HDAC1MAPTRAB9ACA1CA2
SCHEMBL20445882 0.91 HDAC1 (0.59) HDAC1MAPTRAB9ACA1CA2
SCHEMBL15998582 0.90 HDAC1 (0.51) HDAC1MAPTRAB9ACA1CA2
SCHEMBL14228242 0.87 MAPT (0.58) HDAC1MAPTRAB9ACA1CA2
SCHEMBL2605546 0.85 KCNMA1 (0.61) HDAC1MAPTRAB9ACA1CA2
SCHEMBL12510752 0.85 HDAC1 (0.63) HDAC1MAPTRAB9ACA1CA2
SCHEMBL16424442 0.85 HDAC1 (0.64) HDAC1MAPTRAB9ACA1CA2
SCHEMBL29513367 0.85 HDAC1 (0.64) HDAC1MAPTRAB9ACA1CA2
SCHEMBL2605585 0.84 HDAC1 (0.70) HDAC1MAPTRAB9ACA1CA2
SCHEMBL10630369 0.84 HDAC1 (0.53) HDAC1MAPTRAB9ACA1CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 97 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4660705-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RELIEF PATTERN USING SAME, CURED ARTICLE AND ELECTRONIC COMPONENT Toray Industries, Inc. (JP) 2025-12-10 EP disclosed
EP-4651186-A1 METHOD FOR PRODUCING MULTILAYER BODY, AND RESIN COMPOSITION Toray Industries, Inc. (JP) 2025-11-19 EP disclosed
EP-4651185-A1 LAMINATE, SEMICONDUCTOR ELEMENT, AND MEMS ELEMENT Toray Industries, Inc. (JP) 2025-11-19 EP disclosed
US-20250321481-A1 PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO LTD (JP) 2025-10-16 US disclosed
US-20250199401-A1 RESIN COMPOSITION, CURED PRODUCT, ELECTRONIC COMPONENT, AND DISPLAY DEVICE TORAY INDUSTRIES, INC. (JP) 2025-06-19 US disclosed
US-20250189891-A1 POLYIMIDE RESIN PRECURSOR TOKYO OHKA KOGYO CO., LTD. (JP) 2025-06-12 US disclosed
WO-2025100308-A1 RESIN COMPOSITION, CURED PRODUCT, AND DISPLAY DEVICE OR SEMICONDUCTOR DEVICE 東レ株式会社 2025-05-15 WO disclosed
CN-112368641-B Photosensitive resin composition, photosensitive sheet, cured film thereof, method for producing cured film, and electronic component 东丽株式会社 2025-05-02 CN disclosed
WO-2025074871-A1 RESIN, PHOTOSENSITIVE RESIN COMPOSITION AND CURED PRODUCTS OF SAME, AND ELECTRONIC COMPONENT AND DISPLAY DEVICE EACH USING SAID CURED PRODUCT 東レ株式会社 2025-04-10 WO disclosed
WO-2025005007-A1 PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT, AND ELECTRONIC COMPONENT 東レ株式会社 2025-01-02 WO disclosed
US-20150203631-A1 POLYAMIC ACID RESIN COMPOSITION, POLYIMIDE FILM USING SAME, AND METHOD FOR PRODUCING SAID POLYIMIDE FILM TORAY INDUSTRIES, INC. (JP) 2015-07-23 US disclosed
EP-2881417-A1 POLYAMIDE ACID RESIN COMPOSITION, POLYIMIDE FILM USING SAME, AND METHOD FOR PRODUCING SAID POLYIMIDE FILM Toray Industries, Inc. (JP) 2015-06-10 EP disclosed
CN-104508008-A Polyamide acid resin composition, polyimide film using same, and method for producing said polyimide film TORAY INDUSTRIES 2015-04-08 CN disclosed
US-20150045502-A1 POLYAMIDE ACID AND RESIN COMPOSITION CONTAINING SAME TORAY INDUSTRIES, INC. (JP) 2015-02-12 US disclosed
EP-2832769-A1 POLYAMIDE ACID AND RESIN COMPOSITION CONTAINING SAME Toray Industries, Inc. (JP) 2015-02-04 EP disclosed
US-7638254-B2 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD (JP) 2009-12-29 US disclosed
US-20090011364-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC PART HATTORI TAKASHI 2009-01-08 US disclosed
US-7435525-B2 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2008-10-14 US disclosed
US-20070122733-A1 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2007-05-31 US disclosed
EP-1744213-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC COMPONENT Hitachi Chemical DuPont Microsystems Ltd. (JP) 2007-01-17 EP disclosed