SCHEMBL14213208

SCHEMBL14213208

CCC(C)(C)C(=O)OCC1(O)CC2CCC1C2

nearest known ligand 0.31

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
HMGCR P04035 1/20 0.31
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9520649 0.79 LMNA (0.36) ALDH1A1
SCHEMBL47389 0.77
SCHEMBL12533467 0.77
SCHEMBL9924493 0.77 ALDH1A1 (0.33) HMGCRALDH1A1
SCHEMBL9243862 0.76
SCHEMBL47430 0.76
SCHEMBL12972115 0.75
SCHEMBL12405235 0.75 ALDH1A1 (0.35) ALDH1A1
SCHEMBL12405238 0.75 HSD11B1 (0.33) ALDH1A1
SCHEMBL13779563 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8987386-B2 Method of producing polymeric compound, resist composition, and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-03-24 US disclosed
US-8945812-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-02-03 US disclosed
US-8911928-B2 Resist composition, method of forming resist pattern, polymeric compound and method of producing the same TOKYO OHKA KOGYO CO., LTD. (JP) 2014-12-16 US disclosed
US-20130244176-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-09-19 US disclosed
US-20120328993-A1 METHOD OF PRODUCING POLYMERIC COMPOUND, RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-27 US disclosed
US-20120308928-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-06 US disclosed