SCHEMBL14557008

SCHEMBL14557008

CC(C)(C)OC(=O)C1(C(F)(F)F)CCCCC1

nearest known ligand 0.34

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
DGAT1 O75907 1/20 0.34
RIPK1 Q13546 1/20 0.32
TSHR P16473 1/20 0.30
MAPK1 P28482 1/20 0.30
CYP4F2 P78329 1/20 0.30
CYP4A11 Q02928 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4214456 0.81 DGAT1 (0.36) DGAT1
SCHEMBL24515275 0.81 CHRM2 (0.38) DGAT1
SCHEMBL29046563 0.81 CHRM2 (0.38) DGAT1
SCHEMBL24515824 0.81 CHRM2 (0.38) DGAT1
SCHEMBL24515274 0.80 DGAT1 (0.32) DGAT1MAPK1
SCHEMBL9908331 0.80 NPSR1 (0.44) DGAT1RIPK1TSHRMAPK1CYP4F2
Hydrochloric Acid SCHEMBL27952604 0.78 NPSR1 (0.42) DGAT1RIPK1TSHRMAPK1CYP4F2
SCHEMBL9908329 0.78 NPSR1 (0.45) DGAT1RIPK1CYP4F2CYP4A11
SCHEMBL14557006 0.76 ALDH1A1 (0.36) MAPK1
SCHEMBL30659863 0.76 DGAT1 (0.34) DGAT1CYP4F2CYP4A11

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7195856-B2 Positive resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2007-03-27 US disclosed
US-7195856-B2 Positive resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2007-03-27 US disclosed
US-7157206-B2 Resin containing an acid-decomposable group such as bis(trifluoromethyl)methanol group, to generate alkali-soluble group, and acid generators selected from fluorine-substituted or non-fluorine substituted aromatic or aliphatic carboxylic acid generators or sulfonic acid generators; microlithography FUJI PHOTO FILM CO., LTD. (JP) 2007-01-02 US disclosed
US-7157206-B2 Resin containing an acid-decomposable group such as bis(trifluoromethyl)methanol group, to generate alkali-soluble group, and acid generators selected from fluorine-substituted or non-fluorine substituted aromatic or aliphatic carboxylic acid generators or sulfonic acid generators; microlithography FUJI PHOTO FILM CO., LTD. (JP) 2007-01-02 US disclosed