SCHEMBL14655833

SCHEMBL14655833

CCC1(OC([O])=O)CCCC1

nearest known ligand 0.32

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
TSHR P16473 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14655770 0.98 KDM4E (0.30) MEN1KMT2ATSHR
SCHEMBL14991061 0.84 MEN1 (0.32) MEN1KMT2ATSHR
SCHEMBL20484018 0.82 CYP2C19 (0.31) MEN1KMT2ATSHR
SCHEMBL14655834 0.82 MEN1 (0.34) MEN1KMT2ATSHR
SCHEMBL14990797 0.82 CYP2C19 (0.31) MEN1KMT2ATSHR
SCHEMBL143845 0.82 ALDH1A1 (0.33) MEN1KMT2ATSHR
SCHEMBL14883391 0.80 ALDH1A1 (0.32) MEN1KMT2ATSHR
SCHEMBL14839170 0.80 MEN1 (0.30) MEN1KMT2ATSHR
SCHEMBL20484020 0.80 CYP2C19 (0.34) MEN1KMT2ATSHR
SCHEMBL2611791 0.80 OPRM1 (0.33) MEN1KMT2ATSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-106610566-B Chemically amplified positive resist composition and patterning method 信越化学工业株式会社 2021-10-08 CN disclosed
CN-106444288-B Chemically amplified positive resist composition and pattern forming method 信越化学工业株式会社 2021-04-09 CN disclosed
EP-3163374-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHINETSU CHEMICAL CO (JP) 2020-12-02 EP disclosed
EP-3128368-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2018-01-24 EP disclosed
EP-3163374-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2017-05-03 EP disclosed
US-20170115567-A1 Chemically Amplified Positive Resist Composition and Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-04-27 US disclosed
EP-3128368-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2017-02-08 EP disclosed
US-8980525-B2 Chemically amplified positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-17 US disclosed
US-20130026044-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-31 US disclosed
EP-2551722-A1 Chemically amplified positive resist composition and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2013-01-30 EP disclosed