SCHEMBL14913697

SCHEMBL14913697

CC(C)(C)OC(=O)N1CCC(O)CC1.CC(C)(C)OC(=O)N1CCCC1CO

nearest known ligand 0.47

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
HSD17B10 Q99714 1/20 0.47
HPGD P15428 1/20 0.47
POLB P06746 1/20 0.46
L3MBTL1 Q9Y468 1/20 0.46
EPHX1 P07099 1/20 0.45
RECQL P46063 1/20 0.42
NR1H2 P55055 1/20 0.42
MEN1 O00255 1/20 0.41
ALDH1A1 P00352 1/20 0.41
MAPT P10636 1/20 0.41
KMT2A Q03164 1/20 0.41
SMN1; SMN2 Q16637 2/20 0.40
USP2 O75604 1/20 0.40
GPR119 Q8TDV5 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14913696 1.00 HSD17B10 (0.47) HSD17B10HPGDPOLBL3MBTL1EPHX1
SCHEMBL3769598 0.91 HPGD (0.54) HSD17B10HPGDPOLBL3MBTL1EPHX1
SCHEMBL3769601 0.91 HPGD (0.54) HSD17B10HPGDPOLBL3MBTL1EPHX1
SCHEMBL135177 0.89 L3MBTL1 (0.58) HSD17B10HPGDPOLBL3MBTL1NR1H2
SCHEMBL47049 0.89 L3MBTL1 (0.58) HSD17B10HPGDPOLBL3MBTL1NR1H2
SCHEMBL133363 0.89 L3MBTL1 (0.58) HSD17B10HPGDPOLBL3MBTL1NR1H2
Methylene Chloride SCHEMBL28081516 0.85 POLB (0.53) HSD17B10POLBL3MBTL1NR1H2ALDH1A1
SCHEMBL282977 0.84 POLB (0.51) HSD17B10HPGDPOLBL3MBTL1EPHX1
SCHEMBL282976 0.84 POLB (0.51) HSD17B10HPGDPOLBL3MBTL1EPHX1
SCHEMBL192841 0.84 POLB (0.51) HSD17B10HPGDPOLBL3MBTL1EPHX1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8999622-B2 Pattern forming method, chemical amplification resist composition and resist film FUJIFILM CORPORATION (JP) 2015-04-07 US disclosed
US-20130115556-A1 PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2013-05-09 US disclosed