SCHEMBL1593370

SCHEMBL1593370

O=S(=O)([O-])C(F)(F)C(F)(F)C(F)(F)F.c1ccc([S+](c2cccc3ccccc23)c2cccc3ccccc23)cc1

nearest known ligand 0.32

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ELANE P08246 1/20 0.32
PTPN1 P18031 1/20 0.31
RORA P35398 1/20 0.31
RORC P51449 1/20 0.31
NR1H2 P55055 1/20 0.31
NR1H4 Q96RI1 1/20 0.31
CA1 P00915 1/20 0.30
CA2 P00918 1/20 0.30
CA9 Q16790 1/20 0.30
RECQL P46063 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL3626396 0.97 GPR3 (0.33) ELANEPTPN1RORARORCNR1H2
SCHEMBL270055 0.96 ELANE (0.32) ELANEPTPN1RORARORCNR1H2
Trifluoromethanesulfonic Acid SCHEMBL3626393 0.94 RORA (0.31) RORARORCNR1H2NR1H4
SCHEMBL3132397 0.94 ELANE (0.32) ELANEPTPN1RORARORCNR1H2
SCHEMBL3139795 0.92 CA1 (0.32) ELANEPTPN1RORARORCNR1H2
SCHEMBL3127138 0.92 CA1 (0.32) ELANEPTPN1RORARORCNR1H2
Trifluoromethanesulfonic Acid SCHEMBL36034 0.88 GPR3 (0.38) PTPN1RORARORCNR1H2NR1H4
Trifluoromethanesulfonic Acid SCHEMBL31564951 0.88 GPR3 (0.38) PTPN1RORARORCNR1H2NR1H4
Trifluoromethanesulfonic Acid SCHEMBL547976 0.85 GPR3 (0.38) PTPN1RORARORCNR1H2NR1H4
Trifluoromethanesulfonic Acid SCHEMBL29402880 0.85 GPR3 (0.38) PTPN1RORARORCNR1H2NR1H4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20110091818-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-04-21 US disclosed
US-20100279226-A1 RESIST PROCESSING METHOD SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-11-04 US disclosed
US-20100273113-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed
US-20100273112-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed