SCHEMBL1593373

SCHEMBL1593373

Cc1cccc(S)c1C.O=S(=O)(O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F

nearest known ligand 0.34

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
TRPA1 O75762 1/20 0.34
ATM Q13315 1/20 0.34
CA1 P00915 13/20 0.33
CA2 P00918 13/20 0.33
MMP1 P03956 7/20 0.33
MMP2 P08253 7/20 0.33
MMP9 P14780 7/20 0.33
MMP8 P22894 7/20 0.33
MMP13 P45452 7/20 0.33
KEAP1 Q14145 1/20 0.32
NFE2L2 Q16236 1/20 0.32
HSD11B1 P28845 2/20 0.31
HTT P42858 1/20 0.31
HSD17B2 P37059 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1594212 0.95 TRPA1 (0.35) TRPA1ATMKEAP1NFE2L2HSD11B1
Trifluoromethanesulfonic Acid SCHEMBL5356654 0.84 TRPA1 (0.45) TRPA1ATMKEAP1NFE2L2HSD11B1
Trifluoromethanesulfonic Acid SCHEMBL112239 0.84 TRPA1 (0.45) TRPA1ATMKEAP1NFE2L2HSD11B1
Trifluoromethanesulfonic Acid SCHEMBL8088610 0.81 TRPA1 (0.42) TRPA1ATMKEAP1NFE2L2HTT
Sulfuric Acid SCHEMBL482696 0.79 TRPA1 (0.43) TRPA1ATMKEAP1NFE2L2HTT
Sulfuric Acid SCHEMBL3797183 0.79 TRPA1 (0.43) TRPA1ATMKEAP1NFE2L2HTT
Sulfuric Acid SCHEMBL15345267 0.77 HTT (0.39) TRPA1ATMKEAP1NFE2L2HTT
Hydrogen Sulfide SCHEMBL29745849 0.77 F2 (0.38) CA1CA2MMP1MMP2MMP9
SCHEMBL6743597 0.75 CA2 (0.36) CA1CA2MMP1MMP2MMP9
SCHEMBL3129927 0.75 ENPP1 (0.38) CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20110091818-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-04-21 US disclosed
US-20100273113-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed
US-20100273112-A1 PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-10-28 US disclosed