SCHEMBL15935698

SCHEMBL15935698

COc1ccc(C(=O)CN2CCCC2)cc1

nearest known ligand 0.94

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.94
LMNA P02545 2/20 0.75
KDM4E B2RXH2 2/20 0.75
MEN1 O00255 3/20 0.68
KMT2A Q03164 3/20 0.68
HTT P42858 2/20 0.68
POLB P06746 2/20 0.68
MAPT P10636 1/20 0.68
HRH3 Q9Y5N1 2/20 0.62
HPGD P15428 1/20 0.58
PKM P14618 1/20 0.57
TP53 P04637 1/20 0.56

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15503835 0.98 ALDH1A1 (0.97) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL4874455 0.87 ALDH1A1 (0.76) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL4873274 0.86 ALDH1A1 (0.71) ALDH1A1LMNAKDM4EMEN1KMT2A
Hydrochloric Acid SCHEMBL3844533 0.84 ALDH1A1 (0.69) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL14595456 0.84 ALDH1A1 (0.69) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL15033016 0.83 ALDH1A1 (0.68) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL12123619 0.83 ALDH1A1 (0.97) ALDH1A1LMNAMEN1KMT2AHTT
SCHEMBL6500831 0.82 ALDH1A1 (0.68) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL6400029 0.81 ALDH1A1 (0.65) ALDH1A1LMNAKDM4EMEN1KMT2A
SCHEMBL19190490 0.81 ALDH1A1 (0.64) ALDH1A1LMNAKDM4EMEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2014133187-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, ELECTRONIC DEVICE AND COMPOUND FUJIFILM CORPORATION (JP) 2014-09-04 WO disclosed
WO-2014119698-A1 PATTERN FORMING METHOD, COMPOUND USED THEREIN, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2014-08-07 WO disclosed