SCHEMBL16417484

SCHEMBL16417484

C=C(C)C(=O)OCCOC(=O)C1CCN(S(=O)(=O)C(F)(F)S(=O)(=O)NS(=O)(=O)C(F)(F)F)CC1

nearest known ligand 0.35

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 6/20 0.35
TP53 P04637 2/20 0.35
TSHR P16473 2/20 0.35
MAPT P10636 1/20 0.35
HSD17B10 Q99714 1/20 0.35
PKM P14618 4/20 0.33
ATM Q13315 1/20 0.33
KMT2A Q03164 4/20 0.33
MEN1 O00255 2/20 0.33
POLB P06746 2/20 0.33
LMNA P02545 1/20 0.32
L3MBTL1 Q9Y468 1/20 0.32
NPSR1 Q6W5P4 1/20 0.32
GAA P10253 2/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
THRB P10828 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16417265 0.92 TP53 (0.37) ALDH1A1TP53TSHRMAPTHSD17B10
SCHEMBL16417263 0.86 ALDH1A1 (0.38) ALDH1A1TP53TSHRMAPTHSD17B10
SCHEMBL13464399 0.83 THRB (0.33) THRB
SCHEMBL12399482 0.75 TSHR (0.35) ALDH1A1TP53TSHRMAPTHSD17B10
SCHEMBL15935701 0.74 TSHR (0.42) ALDH1A1TP53TSHRMAPTATM
SCHEMBL2785959 0.71 THRB (0.53) ALDH1A1TSHRMAPTPOLBTHRB
SCHEMBL2742241 0.71 THRB (0.41) ALDH1A1TSHRPOLBSMN1; SMN2THRB
SCHEMBL18583854 0.69 THRB (0.42) ALDH1A1TSHRPOLBTHRB
SCHEMBL14703683 0.69
SCHEMBL13160577 0.68 RAB9A (0.39) ALDH1A1TP53TSHRHSD17B10KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160209747-A1 ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, RESIST-COATED MASK BLANK, METHOD FOR PRODUCING PHOTOMASK, PHOTOMASK, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE, EACH OF WHICH USES SAID ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2016-07-21 US disclosed
US-8940476-B2 Pattern forming method, actinic-ray-sensitive or radiation-sensitive resin composition, and resist film FUJIFILM CORPORATION (JP) 2015-01-27 US disclosed