SCHEMBL169922

SCHEMBL169922

O=C(c1ccccc1)C1CCCCO1

nearest known ligand 0.51

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
MCL1 Q07820 1/20 0.49
HPGD P15428 3/20 0.47
GAA P10253 1/20 0.47
FASN P49327 2/20 0.46
ALDH1A1 P00352 3/20 0.46
HTT P42858 1/20 0.45
NPC1 O15118 1/20 0.44
TP53 P04637 1/20 0.44
POLB P06746 1/20 0.44
RAB9A P51151 1/20 0.44
L3MBTL1 Q9Y468 2/20 0.44
TDP1 Q9NUW8 1/20 0.43
NPY2R P49146 1/20 0.43
CYP2C19 P33261 1/20 0.43
PKM P14618 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27351823 0.95 HPGD (0.51) MCL1HPGDGAAFASNALDH1A1
SCHEMBL7167323 0.89 MCL1 (0.46) MCL1HPGDGAAFASNALDH1A1
SCHEMBL4566340 0.87 KMO (0.50) HPGDGAAALDH1A1HTTPOLB
SCHEMBL9389800 0.84 ALDH1A1 (0.54) HPGDFASNALDH1A1NPC1TP53
SCHEMBL1129558 0.83 ALDH1A1 (0.44) HPGDALDH1A1HTTNPC1RAB9A
SCHEMBL14650448 0.83 HPGD (0.45) HPGDALDH1A1HTTNPC1POLB
SCHEMBL4322056 0.81 KDM4E (0.47) HPGDGAAALDH1A1HTTNPC1
SCHEMBL5479885 0.78 HPGD (0.40) HPGDGAAFASNALDH1A1HTT
SCHEMBL9680888 0.77 AKR1C3 (0.44) HPGDGAAFASNALDH1A1NPC1
SCHEMBL13446994 0.77 ALDH1A1 (0.49) MCL1HPGDALDH1A1HTTTP53

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 39 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7153369-B2 Method of chemical mechanical polishing JSR CORPORATION (JP) 2006-12-26 US claimed
US-20020005017-A1 Polishing cycles JSR CORPORATION (JP) 2002-01-17 US claimed
EP-1138734-A2 Aqueous dispersion for chemical mechanical polishing of metal films JSR Corporation (JP) 2001-10-04 EP claimed
US-20250189895-A1 METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-06-12 US disclosed
US-20250172872-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTOSENSITIVE COMPOSITION, METHOD OF MANUFACTURING SUBSTRATE WITH TEMPLATE, AND METHOD OF MANUFACTURING PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-05-29 US disclosed
US-12227863-B2 Anodizing method and manufacturing method for an anisotropic conductive member FUJIFILM CORPORATION (JP) 2025-02-18 US disclosed
US-20230106185-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE DRY FILM, METHOD OF MANUFACTURING PHOTOSENSITIVE DRY FILM, METHOD OF MANUFACTURING PATTERNED RESIST FILM, AND ACID DIFFUSION SUPPRESSING AGENT TOKYO OHKA KOGYO CO., LTD. (JP) 2023-04-06 US disclosed
WO-2022034769-A1 STRUCTURE, STRUCTURE MANUFACTURING METHOD, BONDED BODY MANUFACTURING METHOD, AND DEVICE MANUFACTURING METHOD 富士フイルム株式会社 2022-02-17 WO disclosed
WO-2022004290-A1 CHEMICALLY AMPLIFIED PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE DRY FILM, METHOD FOR MANUFACTURING PLATING MOLD-ATTACHED SUBSTRATE, AND METHOD FOR MANUFACTURING PLATED OBJECT 東京応化工業株式会社 2022-01-06 WO disclosed
US-20210363653-A1 ANODIZING METHOD AND MANUFACTURING METHOD FOR AN ANISOTROPIC CONDUCTIVE MEMBER FUJIFILM CORPORATION (JP) 2021-11-25 US disclosed
WO-2021131538-A1 CHEMICALLY AMPLIFIED POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, METHOD FOR PRODUCING PHOTOSENSITIVE DRY FILM, METHOD FOR PRODUCING PATTERNED RESIST FILM, METHOD FOR PRODUCING SUBSTRATE PROVIDED WITH TEMPLATE, AND METHOD FOR PRODUCING PLATED MODELED OBJECT 東京応化工業株式会社 2021-07-01 WO disclosed
US-20040144755-A1 Aqueous dispersion for chemical mechanical polishing JSR Corporation (50%) (JP) 2004-07-29 US disclosed
US-20020193451-A1 Method of chemical mechanical polishing JSR CORPORATION (JP) 2002-12-19 US disclosed
US-20020010232-A1 Composition for polishing pad and polishing pad using the same JSR CORPORATION (JP) 2002-01-24 US disclosed
US-20020005017-A1 Polishing cycles JSR CORPORATION (JP) 2002-01-17 US disclosed
EP-1164559-A1 Composition for polishing pad and polishing pad using the same JSR Corporation (JP) 2001-12-19 EP disclosed
US-20010049912-A1 Aqueous dispersion for chemical mechanical polishing JSR CORPORATION (JP) 2001-12-13 US disclosed
EP-1138734-A2 Aqueous dispersion for chemical mechanical polishing of metal films JSR Corporation (JP) 2001-10-04 EP disclosed
EP-1138733-A2 Aqueous dispersion for chemical mechanical polishing of insulating films JSR Corporation (JP) 2001-10-04 EP disclosed
EP-1077240-A1 Aqueous dispersion for chemical mechanical polishing JSR Corporation (JP) 2001-02-21 EP disclosed