SCHEMBL1705474

SCHEMBL1705474

[N-]=[N+]=C1C=C(S(=O)(=O)Cl)c2ccccc2C1=O

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PTPN1 P18031 4/20 0.39
CDC25B P30305 4/20 0.37
MEN1 O00255 3/20 0.37
KMT2A Q03164 3/20 0.37
IDO1 P14902 2/20 0.36
DNMT1 P26358 1/20 0.36
DNMT3L Q9UJW3 1/20 0.36
DNMT3A Q9Y6K1 1/20 0.36
MAPT P10636 4/20 0.35
PTPRC P08575 4/20 0.35
MAPK1 P28482 3/20 0.35
KDM4E B2RXH2 3/20 0.35
LMNA P02545 3/20 0.35
BLM P54132 3/20 0.35
SMN1; SMN2 Q16637 3/20 0.35
S100A4 P26447 3/20 0.35
APAF1 O14727 2/20 0.35
TDP2 O95551 2/20 0.35
PLIN1 O60240 2/20 0.35
MAOA P21397 2/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30773549 1.00 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL3399109 0.86 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL3398101 0.86 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AIDO1
Hydrochloric Acid SCHEMBL8031975 0.85 PTPN1 (0.38) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL9774897 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL819290 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL3951332 0.81 PTPN1 (0.62) PTPN1CDC25BMEN1KMT2AIDO1
SCHEMBL3135592 0.81 TDP2 (0.32) TDP2NSD2
SCHEMBL13155865 0.80 HTR6 (0.41) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL13324452 0.80 PTPN1 (0.37) PTPN1CDC25BMEN1KMT2AIDO1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 150 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-1190665-A None JP disclosed
CN-117866205-A Silicon-containing surface modifier and resist underlayer film composition, and preparation method and application thereof 福建泓光半导体材料有限公司 2024-04-12 CN disclosed
CN-117866204-A Silicon-containing surface modifier and etching-resistant agent underlayer film composition, and preparation method and application thereof 福建泓光半导体材料有限公司 2024-04-12 CN disclosed
CN-116430671-A Photoresist composition and photoetching process 上海飞凯材料科技股份有限公司 2023-07-14 CN disclosed
US-11049812-B2 Semiconductor devices and methods of forming the same TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2021-06-29 US disclosed
US-20200286832-A1 SEMICONDCUTOR DEVICES AND METHODS OF FORMING THE SAME TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2020-09-10 US disclosed
US-10665545-B2 Semiconductor devices, semiconductor packages and methods of forming the same TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2020-05-26 US disclosed
US-20200091073-A1 SEMICONDCUTOR DEVICES, SEMICONDCUTOR PACKAGES AND METHODS OF FORMING THE SAME TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2020-03-19 US disclosed
US-9778569-B2 Positive photosensitive resin composition, method for producing film using same, and electronic component CENTRAL GLASS COMPANY, LIMITED (JP) 2017-10-03 US disclosed
US-20160266491-A1 Positive Photosensitive Resin Composition, Method for Producing Film Using Same, and Electronic Component CENTRAL GLASS COMPANY, LIMITED (JP) 2016-09-15 US disclosed
WO-1990013058-A1 HEXAHYDROXYBENZOPHENONE COMPOUNDS AS SENSITIVITY ENHANCERS FOR RADIATION SENSITIVE MIXTURES OLIN HUNT SPECIALTY PRODUCTS INC. (US) 1990-11-01 WO disclosed
US-4957846-A PHOTORESISTS, PHOTOLITHOGRAPHY, PRINTED CIRCUITS OLIN HUNT SPECIALTY PRODUCTS INC. (US) 1990-09-18 US disclosed
WO-1990007538-A1 SELECTED TRINUCLEAR NOVOLAK OLIGOMERS AND THEIR USE IN PHOTOACTIVE COMPOUNDS AND RADIATION SENSITIVE MIXTURES OLIN HUNT SPECIALTY PRODUCTS INC. (US) 1990-07-12 WO disclosed
EP-0328824-A2 Sulfonic acid esters useful as sensitizers for positive resists International Business Machines Corporation (US) 1989-08-23 EP disclosed
US-4853315-A O-quinone diazide sulfonic acid monoesters useful as sensitizers for positive resists INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1989-08-01 US disclosed
JP-H01190665-A SULFONATE ESTER AND POSITIVE RESISTS CONTAINING THE SULFONATE ESTER INTERNATL BUSINESS MACH CORP <IBM> 1989-07-31 JP disclosed
US-4818658-A Photoactive esterification product of a diazooxide compound and a curcumin dye and photoresist materials with product SHIPLEY COMPANY INC. (US) 1989-04-04 US disclosed
US-4797345-A POSITIVE WORKING PHOTORESISTS, MIXTURES WITH RESINS OLIN HUNT SPECIALTY PRODUCTS, INC. (US) 1989-01-10 US disclosed
EP-0297825-A1 Light-sensitive 1,2-naphthoquinone-2-diazide-4-sulfonic acid monoesters and their use in light-sensitive mixtures OCG MICROELECTRONIC MATERIALS, INC. (US) 1989-01-04 EP disclosed
EP-0147596-A2 A positive lithographic resist composition International Business Machines Corporation (US) 1985-07-10 EP disclosed