SCHEMBL819290

SCHEMBL819290

CS(=O)(=O)C1=CC(=[N+]=[N-])C(=O)c2ccccc21

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PTPN1 P18031 4/20 0.39
CDC25B P30305 6/20 0.37
MEN1 O00255 3/20 0.37
KMT2A Q03164 3/20 0.37
MAPT P10636 4/20 0.35
LMNA P02545 3/20 0.35
BLM P54132 3/20 0.35
SMN1; SMN2 Q16637 3/20 0.35
RAB9A P51151 3/20 0.35
PLIN1 O60240 2/20 0.35
MAOA P21397 2/20 0.35
MAPK1 P28482 2/20 0.35
PLIN5 Q00G26 2/20 0.35
ABHD5 Q8WTS1 2/20 0.35
KDM4E B2RXH2 2/20 0.35
POLB P06746 2/20 0.35
S100A4 P26447 2/20 0.35
APAF1 O14727 2/20 0.35
TDP2 O95551 2/20 0.35
NPC1 O15118 2/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15334634 0.85 PTGS2 (0.33) PTPN1PTGS2
SCHEMBL13324452 0.83 PTPN1 (0.37) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL1705474 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL9774897 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL3399109 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL30773549 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL3398101 0.83 PTPN1 (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL12268106 0.82 MAPT (0.39) PTPN1CDC25BMEN1KMT2AMAPT
SCHEMBL15624668 0.82 PTPN1 (0.36) PTPN1CDC25BMEN1KMT2AMAPT
Hydrochloric Acid SCHEMBL8031975 0.81 PTPN1 (0.38) PTPN1CDC25BMEN1KMT2AMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 153 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240210827-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-06-27 US disclosed
US-20240018306-A1 RESIN COMPOSITION, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, CURED PRODUCT, SEMICONDUCTOR DEVICE, AND METHOD FOR SYNTHESIZING POLYIMIDE PRECURSOR RESONAC CORPORATION (JP) 2024-01-18 US disclosed
US-11822242-B2 DNQ-type photoresist composition including alkali-soluble acrylic resins MERCK PATENT GMBH (DE) 2023-11-21 US disclosed
US-20230369271-A1 DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE TORAY INDUSTRIES, INC. (JP) 2023-11-16 US disclosed
US-11802181-B2 Di-amine compound, and heat-resistant resin and resin composition using the same TORAY INDUSTRIES, INC. (JP) 2023-10-31 US disclosed
US-11768434-B2 Polymer having a structure of polyamide, polyamide-imide, or polyimide, photosensitive resin composition, patterning process, photosensitive dry film, and protective film for electric and electronic parts SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-26 US disclosed
US-20230221639-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-07-13 US disclosed
US-11640112-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-05-02 US disclosed
US-20180224741-A1 COMPOSITIONS AND METHODS FOR FORMING A PIXEL-DEFINING LAYER ROHM & HAAS ELECT MAT (US) 2018-08-09 US disclosed
US-20180203353-A1 CURED FILM AND METHOD FOR MANUFACTURING SAME TORAY INDUSTRIES, INC. (JP) 2018-07-19 US disclosed
US-20080020317-A1 Novel metal nanoparticle and formation of conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2008-01-24 US disclosed
US-7256419-B2 Composition for forming organic insulating film and organic insulating film formed from the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-08-14 US disclosed
US-20070154843-A1 Resin and resin composition ASAHI KASEI EMD CORPORATION (JP) 2007-07-05 US disclosed
US-7238455-B2 Mixture of alkali soluble resin, quinonediazide compound and alcohol SUMITOMO BAKELITE COMPANY, LTD. (JP) 2007-07-03 US disclosed
US-7229747-B2 Surface treatment of interpenetrating polymer networkcarbon tubes; photolithography; heat curing; negative patterns SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-06-12 US disclosed
US-20070122733-A1 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2007-05-31 US disclosed
US-7220520-B2 Photosensitive resin compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2007-05-22 US disclosed
US-7214455-B2 Photosensitive resin composition and process for producing heat-resistant resin film TORAY INDUSTRIES, INC. (JP) 2007-05-08 US disclosed
US-20070099111-A1 Novel positive photosensitive polybenzoxazole precursor compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 2007-05-03 US disclosed
US-7195849-B2 Photosensitive resin compositions ARCH SPECIALTY CHEMICALS, INC. (US) 2007-03-27 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11802181-B2 Di-amine compound, and heat-resistant resin and resin composition using the same CAD, ARID2, SMC3 PTPN1 4574/4885CDC25B 3722/4885MEN1 4033/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.